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Thermal analysis of rare earth gallates and aluminates

Published online by Cambridge University Press:  31 January 2011

H. M. O'Bryan ,
P. K. Gallagher ,
G. W. Berkstresser  and
C. D. Brandle
H. M. O'Bryan
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
P. K. Gallagher
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
G. W. Berkstresser
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
C. D. Brandle
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
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Abstract

Dilatometry, high-temperature x-ray diffraction, differential thermal analysis, and differential scanning calorirmetry have been performed on LaGaO3, NdGaO3, PrGaO3, SmAlO3, and LaAlO3 single crystals grown by the Czochralski technique. First order phase transitions have been located at 145°C for LaGaO3 and 785°C for SmAlO3, and ΔH has been measured for the LaGaO3 transition. Second order transitions have been identified for LaGaO3, PrGaO3, NdGaO3, and LaAlO3. The usefulness of these compounds as substrates for high temperature superconducting films is discussed in terms of thermal expansion matching.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 1 , January 1990 , pp. 183 - 189
Copyright
Copyright © Materials Research Society 1990

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References

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