Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-26T03:53:50.389Z Has data issue: false hasContentIssue false

Texture development in Ba2YCu3O7−x films from trifluoroacetate precursors

Published online by Cambridge University Press:  31 January 2011

Paul C. McIntyre
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Michael J. Cima
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Man Fai Ng
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Raymond C. Chiu
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Wendell E. Rhine
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Get access

Abstract

The effect of heat treatment on microstructure development in Ba2YCu3O7−x films prepared from metal trifluoroacetate precursors is investigated. The growth of textured Ba2YCu3O7−x on BaZrO3 substrates is shown to be strongly influenced by the furnace atmosphere used during calcination. Differential thermal analysis was used to show that conditions that promote c-axis texture are also those which cause partial melting of Ba–Y–Cu–O compositions that are depleted in barium relative to Ba2YCu3O7−x.

Type
Articles
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Chiang, Y-M., Furcone, S. L., Ikeda, J. A. S., and Rudman, D. A., in High-Temperature Superconductors, edited by Brodsky, M. B., Dynes, R. C., Kitazawa, K. and Tuller, H. L. (Mater. Res. Soc. Symp. Proc. 99, Pittsburgh, PA, 1988), pp. 307310.Google Scholar
2Gross, M. E., Hong, M., Liou, S. H., Gallagher, P. K., and Kwo, J., Appl. Phys. Lett. 52 (2), 160162 (1988).CrossRefGoogle Scholar
3Kumagai, T., Yokota, H., Kawaguchi, K., Kondo, W., and Mizuta, S., Chem. Lett. 1987, 16451646 (1987).CrossRefGoogle Scholar
4Mantese, J. V., Hamadi, A. H., Chen, Y. L., Wong, C. A., Johnson, J. L., Karmarkar, M. M., and Padman, K. R., Appl. Phys. Lett. 52 (19), 16311633 (1988).CrossRefGoogle Scholar
5Klee, M., Brand, W., and DeVries, J. W. C., J. Cryst. Growth 91, 346351 (1988).CrossRefGoogle Scholar
6Parmigiani, F., Chiarello, G., Ripamonti, N., Goretzki, H., and Roli, U., Phys. Rev. B 36, 71487150 (1987).CrossRefGoogle Scholar
7Gupta, A., Jagannathan, R., Cooper, E. I., Geiss, E. A., Landman, J. I., and Hussey, B. W., Appl. Phys. Lett. 52 (24), 20772079 (1988).CrossRefGoogle Scholar
8Gupta, A., Cooper, E. I., Jagannathan, R., and Geiss, E. A., in Chemistry of High-Temperature Superconductors II, edited by Nelson, D. L. and George, T. F. (American Chemical Society, Washington, DC, 1988), p. 265.CrossRefGoogle Scholar
9Burton, R. L., Segre, C. U., Marcy, H. O., and Kannewurf, C. R., “Microstructural Investigation of YBa2Cu3O7−d Films Deposited by Laser Ablation from BaF2/Y2O3/CuO Targets,” submitted to SERI conference, Colorado Springs, CO, 1988.CrossRefGoogle Scholar
10Chan, S-W., Hwang, D-M., and Nazar, L., J. Appl. Phys. 65 (12), 47194722 (1989).CrossRefGoogle Scholar
11Cima, M. J., Schneider, J. S., Peterson, S. C., and Coblenz, W., Appl. Phys. Lett. 53 (8), 710712 (1988).CrossRefGoogle Scholar
12Ullman, J. E., McCallum, R. W., and Verhoeven, J. D., J. Mater. Res. 4, 752754 (1989).CrossRefGoogle Scholar
13Hauck, J., Brickmann, K., and Zucht, F., J. Mater. Res. 2, 762765 (1987).CrossRefGoogle Scholar
14Aselage, T. and Keefer, K., J. Mater. Res. 3, 12791291 (1989).CrossRefGoogle Scholar
15Kingery, W. D., Bowen, H. K., and Uhlmann, D. R., Introduction to Ceramics (John Wiley & Sons, New York, 1976), pp. 461465.Google Scholar
16Gungulee, A., J. Appl. Phys. 45 (9), 37493756 (1974).CrossRefGoogle Scholar
17Thompson, C. V. and Smith, H. I., Appl. Phys. Lett. 44 (6), 603605 (1984).CrossRefGoogle Scholar
18Ezoe, M. and Kato, E., Yogyo-Kyokai-Shi 95 (12), 12071212 (1987).CrossRefGoogle Scholar
19Thompson, C. V., J. Appl. Phys. 58 (2), 763772 (1985).CrossRefGoogle Scholar