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TEM analysis of Co–Gd and Co–Gd multilayer structures

Published online by Cambridge University Press:  31 January 2011

G.A. Bertero ,
T.C. Hufnagel ,
B.M. Clemens  and
R. Sinclair
G.A. Bertero
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205
T.C. Hufnagel
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205
B.M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205
R. Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205
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Abstract

Sputter-deposited Co–Gd and Cr–Gd multilayer films were studied by high resolution transmission electron microscopy (HRTEM). These two systems are expected to give rise to quite different structures. In good agreement with predictions, the individual Cr and Gd layers were found to be 100% crystalline with sharp interfaces and no noticeable intermixing. Conversely, the Co–Gd multilayer system underwent a solid state amorphization reaction during the deposition itself. This reaction has been found elsewhere to show an asymmetric character with the order of deposition, strong evidence for which is observed in this work.

Type
Articles
Information
Journal of Materials Research , Volume 8 , Issue 4 , April 1993 , pp. 771 - 774
Copyright
Copyright © Materials Research Society 1993

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References

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