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Surface stability of epitaxial SrRuO3 thin films in vacuum

Published online by Cambridge University Press:  01 December 2004

J. Shin ,
S.V. Kalinin ,
H.N. Lee ,
H.M. Christen ,
R.G. Moore ,
E.W. Plummer  and
A.P. Baddorf
J. Shin*
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996
S.V. Kalinin
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.N. Lee
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.M. Christen
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
R.G. Moore
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996
E.W. Plummer
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996
A.P. Baddorf
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Surface stability of nearly defect-free epitaxial SrRuO3 thin films grown by pulsed laser deposition was studied using low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), and electron spectroscopies. Even after exposure to atmosphere, surfaces exhibited distinct LEED patterns providing evidence of unusual chemical stability. Surface order disappeared after heating to 200 °C in vacuum. To investigate, SrRuO3 thin films were annealed up to 800 °C in high vacuum and examined for chemical state and topography. Formation of unit-cell deep pits and the Ru-rich particles begins at low temperatures. Hydrocarbon contamination on the surface contributes to this process.

Keywords

Pulsed laser deposition (PLD)Surface chemistryThermodynamic properties
Type
Rapid Communications
Information
Journal of Materials Research , Volume 19 , Issue 12 , December 2004 , pp. 3447 - 3450
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1Klein, L., Dodge, J.S., Ahn, C.H., Reiner, J.W., Mieville, L., Geballe, T.H., Beasley, M.R. and Kapitulnik, A.: Transport and magnetization in the badly metallic itinerant ferromagnet SrRuO3. J. Phys. Condens. Matter 8, 10111 (1996).CrossRefGoogle Scholar
2Cao, G., McCall, S. and Crow, J.E.: Observation of itinerant ferromagnetism in layered Sr3Ru2O7 single crystals. Phys. Rev. B 55, R672 (1997).CrossRefGoogle Scholar
3Eom, C.B., Cava, R.J., Fleming, R.M., Phillips, J.M., van Dover, R.B., Marshall, J.H., Hsu, J.W.P., Krajewski, J.J., Peck, W.F. and Jr., : Single-crystal epitaxial thin films of the isotropic metallic oxides Sr1− x Cax RuO3 (0 ⩽ x ⩽ 1). Science 258, 1766 (1992).Google ScholarPubMed
4Lee, H.N., Christen, H.M., Chisholm, M.H., Rouleau, C.M. and Lowndes, D.H.: Thermal stability of epitaxial SrRuO3 films as a function of oxygen pressure. Appl. Phys. Lett. 84, 4107 (2004).CrossRefGoogle Scholar
5 H.N. Lee and M.F. Chisholm: unpublished.Google Scholar
6Rijinders, G., Blank, D.H.A., Choi, J. and Eom, C.B.: Enhanced surface diffusion through termination conversion during epitaxial SrRuO3 growth. Appl. Phys. Lett. 84, 505 (2004).CrossRefGoogle Scholar
7Ismail, Zhang, J., Matzdorf, R., Kimura, T., Tokura, Y. and Plummer, E.W.: Surface lattice dynamics of layered transition metal oxide: Sr2RuO4 and La0.5Sr1.5MnO4. Phys. Rev. B 67, 035407 (2003).CrossRefGoogle Scholar
8Cox, P.A., Egdell, R.G., Goodenough, J.B., Hamnett, A. and Naish, C.C.: The metal-to-semiconductor transition in ternary ruthenium (IV) oxides: A study by electron spectroscopy. J. Phys. C 16, 6221 (1983).CrossRefGoogle Scholar
9Moulder, J.F., Stickle, W.F., Sobol, P.E. and Bomben, K.D.: Handbook of X-ray Photoelectron Spectroscopy (Physical Electronics, Inc., Eden Prairie, MN, 1995).Google Scholar
10 J. Shin, S.V. Kalinin, H.N. Lee, H.M. Christen, R.G. Moore, E.W. Plummer, and A.P. Baddorf: unpublished.Google Scholar