Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Won Kyoung Choi
Sung K. Kang
Yoon Chul Sohn
and
Da-Yuan Shih
2003.
Study of IMC morphologies and phase characteristics affected by the reactions of Ni and Cu metallurgies with Pb-free solder joints.
p.
1190.
Kumar, A.
He, M.
Chen, Z.
and
Teo, P.S.
2004.
Effect of electromigration on interfacial reactions between electroless Ni-P and Sn–3.5% Ag solder.
Thin Solid Films,
Vol. 462-463,
Issue. ,
p.
413.
Sohn, Y.C.
Yu, Jin
Kang, S.K.
Shih, D.Y.
and
Lee, T.Y.
2004.
Spalling of intermetallic compounds during the reaction between lead-free solders and electroless Ni-P metallization.
Journal of Materials Research,
Vol. 19,
Issue. 8,
p.
2428.
Sohn, Y. C.
Yu, Jin
Kang, S. K.
Shih, D. Y.
and
Choi, W. K.
2004.
Effects of phosphorus content on the reaction of electroless Ni-P with Sn and crystallization of Ni-P.
Journal of Electronic Materials,
Vol. 33,
Issue. 7,
p.
790.
Yoon-Chul Sohn
Jin Yu
Kang, S.K.
Da-Yuan Shih
and
Taek-Yeong Lee
2004.
Study of spalling behavior of intermetallic compounds during the reaction between electroless Ni-P metallization and lead-free solders.
p.
75.
Yoon-Chul Sohn
Jin Yu
Kang, S.K.
Da-Yuan Shih
and
Taek-Yeong Lee
2005.
Effect of Intermetallics Spalling on the Mechanical Behavior of Electroless Ni(P)/Pb-Free Solder Interconnection.
Vol. 2,
Issue. ,
p.
83.
Hsiao, Li-yin
and
Duh, Jenq-gong
2005.
Intermetallic Compound Formation and Diffusion Path Evolution in the Flip Chip Sn-37Pb Solder Bump after Aging.
p.
1.
Huang, Zhiheng
Conway, Paul P.
Liu, Changqing
and
Thomson, Rachel C.
2005.
Effect of solder bump geometry on the microstructure of Sn–3.5 wt% Ag on electroless nickel immersion gold during solder dipping.
Journal of Materials Research,
Vol. 20,
Issue. 3,
p.
649.
Sohn, Yoon-Chul
and
Yu, Jin
2005.
Correlation Between Chemical Reaction and Brittle Fracture Found in Electroless Ni(P)/immersion gold–solder Interconnection.
Journal of Materials Research,
Vol. 20,
Issue. 8,
p.
1931.
Lin, Yung-Chi
and
Duh, Jenq-Gong
2006.
Phase transformation of the phosphorus-rich layer in SnAgCu/Ni–P solder joints.
Scripta Materialia,
Vol. 54,
Issue. 9,
p.
1661.
Hsu, Yu-Ching
and
Duh, Jenq-Gong
2006.
Diffusion behavior of Cu in Cu/electroless Ni and Cu/electroless Ni/Sn-37Pb solder joints in flip chip technology.
Journal of Electronic Materials,
Vol. 35,
Issue. 12,
p.
2164.
Bailey, Christopher
Hsiao, Li‐Yin
and
Duh, Jenq‐Gong
2006.
Intermetallic compound formation and diffusion path evolution in eutectic tin‐lead flip chip solder bumps after aging.
Soldering & Surface Mount Technology,
Vol. 18,
Issue. 2,
p.
18.
Hsiao, Li-Yin
Jang, Guh-Yaw
Wang, Kai-Jheng
and
Duh, Jenq-Gong
2007.
Inhibiting AuSn4 Formation by Controlling the Interfacial Reaction in Solder Joints.
Journal of Electronic Materials,
Vol. 36,
Issue. 11,
p.
1476.
Lin, Yung-Chi
Shih, Toung-Yi
Tien, Shih-Kang
and
Duh, Jenq-Gong
2007.
Morphological and Microstructural Evolution of Phosphorous-Rich Layer in SnAgCu/Ni-P UBM Solder Joint.
Journal of Electronic Materials,
Vol. 36,
Issue. 11,
p.
1469.
Song, Jae Yong
2007.
Layered intermetallic compounds and stress evolution in Sn and Ni(P) films.
Journal of Materials Research,
Vol. 22,
Issue. 7,
p.
2025.
Lin, Yung-Chi
Shih, Toung-Yi
Tien, Shih-Kang
and
Duh, Jenq-Gong
2007.
Suppressing Ni–Sn–P growth in SnAgCu/Ni–P solder joints.
Scripta Materialia,
Vol. 56,
Issue. 1,
p.
49.
Lee, Chien Wei
Hung, Liang Yi
Chang, Chiang Cheng
Wang, Yu Po
and
Hsiao, C.S.
2008.
The Investigation of Intermetallic Compound Morphology Effect on the Solder Joint Performance.
p.
263.
Jang, D. M.
and
Yu, Jin
2008.
Effect of alloying W in Ni(5P) metallization of solder joints.
p.
141.
Sohn, Yoon-Chul
Kim, Yong-Churl
Kang, Ho-suk
Jung-Na Heo
and
In-Taek Han
2009.
Application of Electroless Ni(P) Metallization to LCD Backlight Unit with Carbon Nanotube Field Emitters.
p.
1690.
Tai, F.C.
Wang, K.J.
and
Duh, J.G.
2009.
Application of electroless Ni–Zn–P film for under-bump metallization on solder joint.
Scripta Materialia,
Vol. 61,
Issue. 7,
p.
748.