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Structures and properties of (001)-oriented Pb(Zr,Ti)O3 films on LaNiO3/Si(001) substrates by pulsed laser deposition

Published online by Cambridge University Press:  31 January 2011

Sang Sub Kim ,
Tae Soo Kang  and
Jung Ho Je
Sang Sub Kim*
Affiliation:
Department of Materials Science and Metallurgical Engineering and Research and Development Center for Automobile's Parts and Materials, Sunchon National University, Sunchon 540–742, Korea
Tae Soo Kang
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang 790–784, Korea
Jung Ho Je*
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang 790–784, Korea
*
a)[email protected]
b)[email protected]
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Abstract

In Pb(Zr0.4Ti0.6)O3 (PZT) (110-nm-thick) films grown on (001)-oriented LaNiO3 (LNO) (50-nm-thick)/Si(001) films by pulsed laser deposition, the microstructures and various structural properties of the PZT and the underlying LNO films were comparatively studied mainly using synchrotron x-ray scattering experiments. Basically, the PZT films resembled the LNO films in microstructure, crystal orientation, and mosaic distribution. The PZT films, however, showed an isotropic structural order (in- and out-of-plane coherence lengths: 18 and 14 nm) in contrast to the anisotropic order of the LNO films (in- and out-of-plane coherence lengths: 5 and 30 nm). The PZT/LNO/Si systems displayed a good hysteresis characteristic (remanent polarization, 11.8 μC/cm2; coercive field, 36.1 kV/cm). We confirmed that oriented PZT films with reasonable ferroelectric properties can be successfully prepared on properly textured LNO films at a relatively low processing temperature.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 12 , December 2000 , pp. 2881 - 2886
Copyright
Copyright © Materials Research Society 2000

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