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Structural comparison of Ba1−xKxBiO3 superconducting thin films

Published online by Cambridge University Press:  03 March 2011

C. Ciofi ,
C.E. Platt ,
J.A. Eades ,
Jun Amano  and
R. Hu
C. Ciofi
Affiliation:
Dipartimento di Ingegneria dell' Informazione via Diotisalvi 2, 56126 Pisa, Italy
C.E. Platt
Affiliation:
Science and Technology Center for Superconductivity, 104 South Goodwin, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
J.A. Eades
Affiliation:
Science and Technology Center for Superconductivity, 104 South Goodwin, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
Jun Amano
Affiliation:
Hewlett-Packard Laboratories, 3500 Deer Creek Road, Palo Alto, California 94303
R. Hu
Affiliation:
TRW, R1/2170 One Space Park, Redondo Beach, California 90278
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Abstract

The microstructure of Ba1−xKxBiO3 (BKBO) thin films from three different sources has been extensively compared by transmission electron microscopy studies. The three films were prepared independently in three different laboratories on three different substrates of (100) orientation and displayed excellent superconducting properties. The observed microstructure is remarkably similar in the three films. They are epitaxial with (100) orientation through all their extension and no cracks have been observed. Their defect density is similar and the resulting extension of defect-free regions is of the order of 50–80 nm.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 2 , February 1994 , pp. 305 - 313
Copyright
Copyright © Materials Research Society 1994

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References

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