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Structural characterization of TiO2 ultrafine particles

Published online by Cambridge University Press:  31 January 2011

Yingchun Zhu ,
Tiao Liu  and
Chuanxian Ding
Yingchun Zhu
Affiliation:
Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 200050, People's Republic of China
Tiao Liu
Affiliation:
Solid State Physical Laboratory, Henan University, Kaifeng, 475001, People's Republic of China
Chuanxian Ding
Affiliation:
Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 200050, People's Republic of China
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Abstract

Four samples of TiO2 ultrafine particles (UFP) were obtained through different processes. The structure of TiO2 ultrafine particles and the factors influencing the structure were investigated with Raman spectroscopy, Fourier transform infrared (FTIR) spectroscopy, and x-ray diffraction (XRD). Both Raman spectra and x-ray diffractograms show the similar regularity of the phase transformation among the four samples. The observed bimodal lineshape-structure in the Raman spectra is attributed to the intragrain and grain-boundary components of TiO2 UFP. The crystal structure of TiO2 UFP is found to be distorted by the surface structure such as OH and OCH2CH3 groups coordinated on the surface of TiO2 UFP.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 2 , February 1999 , pp. 442 - 446
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Herr, U., Jing, J., Birringer, R., Gonser, U., and Gleiter, H., Appl. Phys. Lett. 50, 472 (1987).CrossRefGoogle Scholar
2.Kormann, C., Bahnemann, D.W., and Hoffmann, M.R., J. Phys. Chem. 92, 5196 (1988).CrossRefGoogle Scholar
3.Campostrini, R., Carturan, G., Palmisano, L., Schiavello, M., and Scalafani, A., Mater. Chem. Phys. 38, 277 (1994).CrossRefGoogle Scholar
4.Haro-Poniatowski, E., Rodriguez-Talavera, R., De La Cruz Hevedia, M., Cano-Corona, O., and Arroyo-Murillo, R., J. Mater. Res. 9, 2102 (1994).CrossRefGoogle Scholar
5.Suhail, M. H., Monan Rao, G., and Mohan, S., J. Appl. Phys. 71, 1421 (1992).CrossRefGoogle Scholar
6.Yang, G. X., Zhuang, H. R., and Biswas, P., Nanostruct. Mater. 7 (6), 675 (1996).CrossRefGoogle Scholar
7.Melendres, C.A., Narayanasamy, A., Maroni, V.A., and Siegel, R.W., J. Mater. Res. 4, 1246 (1989).CrossRefGoogle Scholar
8.Komazawa, H., Otsuki, H., and Sada, E., J. Mater. Sci. Lett. 12, 839 (1993).CrossRefGoogle Scholar
9.Hague, D. C. and Mayo, M. J., J. Am. Ceram. Soc. 77 (7), 1957 (1994).CrossRefGoogle Scholar
10.Parker, J. C. and Siegel, R. W., J. Mater. Res. 5, 1246 (1990).CrossRefGoogle Scholar
11.Ohsaka, T., Yamaoka, S., and Shimomura, O., Solid State Commun. 30, 345 (1979).CrossRefGoogle Scholar
12.Tanaka, K. and White, J. M., J. Phys. Chem. 86, 4708 (1982).CrossRefGoogle Scholar
13.Primet, M., Pichat, P., and Mathieu, M. V., J. Phys. Chem. 75, 1216 (1971).CrossRefGoogle Scholar
14.Capwell, R. J., Spagnolo, F., and Desena, M. A., Appl. Spectrosc. 26 (5), 537 (1972).CrossRefGoogle Scholar
15.Hang, J. H., Gao, L., Chen, J. Y., and Yan, D. S., J. Inorg. Mater. 11 (1), 51 (1996).Google Scholar
16.Pawlewicz, W. T., Exarhos, G. J., and Conaway, W.E., Appl. Opt. 22 (12), 1837 (1983).CrossRefGoogle Scholar
17.Nakanshi, K. and Solomon, P. H., Infrared Absorption Spectroscopy, 2nd ed. (Holden-Day, Inc., 500 Sansome Street, San Francisco, Ca, 1977) p. 14.Google Scholar
18.Adams, R. W., Martion, R. L., and Winter, G., Aust. J. Chem. 20, 773 (1967).CrossRefGoogle Scholar
19.Doeuff, S., Henry, M., Sanchez, C., and Livage, J., J. Non-Cryst. Solids 89, 206 (1987).CrossRefGoogle Scholar
20.Nakamoto, K., Infrared and Raman Spectra of Inorganic and Coordination Compounds, 4th ed. (John Wiley & Sons Inc., New York, 1986), p. 230.Google Scholar
21.Mütschele, T. and Kirchheleim, R., Scripta Metall. 21, 1101 (1987).CrossRefGoogle Scholar
22.Meng, J. F., Zou, G. T., Cui, Q. L., Li, X., Tang, J. X., and Zhuo, M. Y., Acta Physica Sinica 42 (12), 2014 (1993).CrossRefGoogle Scholar