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Structural characterization of a new layered-ternary Ta4AlC3 ceramic

Published online by Cambridge University Press:  03 March 2011

Z.J. Lin ,
M.J. Zhuo ,
Y.C. Zhou ,
M.S. Li  and
J.Y. Wang
Z.J. Lin
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People’s Republic of China; and Graduate School of Chinese Academy of Sciences, Beijing 100039, People’s Republic of China
M.J. Zhuo
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People’s Republic of China; and Graduate School of Chinese Academy of Sciences, Beijing 100039, People’s Republic of China
Y.C. Zhou*
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People’s Republic of China
M.S. Li
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People’s Republic of China
J.Y. Wang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People’s Republic of China
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Bulk Ta4AlC3, a new layered-ternary carbide in the Ta–Al–C system, was synthesized and characterized. Transmission electron microscopy investigations on this new phase are reported here. Selected area electron diffraction and convergent beam electron diffraction analyses indicated that this ternary carbide crystallized with the space group P63/mmc. Atomic-scale microstructures of Ta4AlC3 were achieved by means of high-resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. The experimental crystal structural parameters agreed well with the theoretical values obtained using density-functional calculations.

Keywords

CeramicTransmission electron microscopy (TEM)Ta
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 10 , October 2006 , pp. 2587 - 2592
Copyright
Copyright © Materials Research Society 2006

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