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Structural and Electronic Properties of (CdTe)1−x(In2Te3)x Films Grown by Close-spaced vapor Transport Combined with Free Evaporation

Published online by Cambridge University Press:  31 January 2011

M. Zapata-Torres ,
Y. P. Mascarenhas ,
M. A. Santana-Aranda ,
J. Luyo-Alvarado ,
M. Melé-Lirandez ,
A. Zapata-Navarro ,
S. Jimé-Sandovalnez ,
R. Castro-Rodriguez  and
J. L. Peña
M. Zapata-Torres
Affiliation:
Instituto de Fisica de São Carlos-Universidade de São Paulo, Caixa Postal 369, CEP 13560-940, São Carlos, SP, Brazil, and Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada del Instituto Politécnico Nacional, Altamira, Km. 14.5 carretera Tampico-puerto Altamira, Altamira, Tamaulipas, C.P. 89600, Mexico
Y. P. Mascarenhas
Affiliation:
Instituto de Fisica de São Carlos-Universidade de São Paulo, Caixa Postal 369, CEP 13560-940, São Carlos, SP, Brazil
M. A. Santana-Aranda
Affiliation:
Departamento de Fisica, Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Apdo. Postal 14-740, México D.F. 07000, Mexico
J. Luyo-Alvarado
Affiliation:
Departamento de Fisica, Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Apdo. Postal 14-740, México D.F. 07000, Mexico
M. Melé-Lirandez
Affiliation:
Departamento de Fisica, Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Apdo. Postal 14-740, México D.F. 07000, Mexico
A. Zapata-Navarro
Affiliation:
Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada del Instituto Politécnico Nacional, Altamira, Km. 14.5 carretera Tampico-puerto Altamira, Altamira, Tamaulipas, 89600, Mexico
S. Jimé-Sandovalnez
Affiliation:
Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Unidad Querétaro, Apdo. Postal 1-1010, Querétaro, Qro. 76001, Mexico
R. Castro-Rodriguez
Affiliation:
Departamento de Fisica Aplicada, Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Unidad Mérida, Apdo. Postal 73 Cordemex, Mérida, Yuc. 97310, Mexico
J. L. Peña
Affiliation:
Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada del Instituto Politécnico Nacional, Altamira, Km. 14.5 carretera Tampico-puerto Altamira, Altamira, Tamaulipas, 89600, Mexico, and Departamento de Fisica AplÞcada, Centro de Investigación y Estudios Avanzados del Instituto Politécnico Nacional, Unidad Mérida, Apdo. Postal 73 Cordemex, Mérida, Yuc. 97310, Mexico
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Abstract

The structural and electronic properties of (CdTe)1−x(In2Te3)x thin films as a function of substrate temperature were studied using x-ray diffraction, energy dispersive x-ray analysis, and Raman, transmission, and modulated transmission spectroscopies. The films were grown by the close-spaced vapor transport technique combined with free evaporation; CdTe and In2Te3 were used as sources. From x-ray diffraction the presence of mixed phases and differences in composition were detected, and good correlation with Raman spectroscopy was found. Transmission spectroscopy suggested the possibility of a modulation of the band gap of the alloy from a value as low as 0.5 eV up to 1.5 eV. Single-phase films presented a direct band gap of around 1.15 eV, as obtained from modulated transmission measurements.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 8 , August 2000 , pp. 1811 - 1815
Copyright
Copyright © Materials Research Society 2000

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References

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