Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T22:17:14.887Z Has data issue: false hasContentIssue false
  • English
  • Français

A solvothermal route to wurtzite ZnSe nanoparticles

Published online by Cambridge University Press:  31 January 2011

J. H. Zhan ,
X. G. Yang ,
W. X. Zhang ,
D. W. Wang ,
Y. Xie  and
Y. T. Qian
J. H. Zhan
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
X. G. Yang
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
W. X. Zhang
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
D. W. Wang
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Y. Xie
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Y. T. Qian*
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
*
a)Address all correspondence to this author.
Get access

Abstract

Zinc powder reacts with equivalent elemental selenium in solvent ethylenediamine at 120 °C for 6 h to form a complex, which is converted to ZnSe nanoparticles by pyrolysis or protonization. X-ray diffraction results suggest that the as-formed products have wurtzite structure. Transmission electron microscopy observation show that particles with spherical and laminar morphology were produced by pyrolysis and protonization, respectively. The formation of ZnSe nanoparticles is also investigated by infrared and thermal analysis.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 3 , March 2000 , pp. 629 - 632
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Mcclean, I.P. and Thomas, C.B., Semicond. Sci. Technol. 7, 1394 (1992).CrossRefGoogle Scholar
2.Bawendi, M.G., Carroll, D.J., Wilson, W.L., and Brus, L.E., J. Chem. Phys. 96, 5649 (1992).CrossRefGoogle Scholar
3.Rossetti, R., Hull, R., Gibson, J.M., and Brus, L.E., J. Chem. Phys. 82, 552 (1985).CrossRefGoogle Scholar
4.Haase, M.A., Qiu, J., Depuydt, J.M., and Cheng, H., Appl. Phys. Lett. 59, 1272 (1991).CrossRefGoogle Scholar
5.Harris, M.C., Chang, Y.H., Chen, Y.F., Hsu, J.W., Lin, J.M., and Chou, W.C., Appl. Phys. Lett. 70, 2413 (1997).CrossRefGoogle Scholar
6.Stuczynski, S.M., Brennan, J.G., and Steigerwald, M.L., Inorg. Chem. 28, 4431 (1989).CrossRefGoogle Scholar
7.Cheon, J. and Zink, J.I., J. Am. Chem. Soc. 119, 3838 (1997).CrossRefGoogle Scholar
8.Ludolph, B., Malik, M.A., O'Brien, P., and Revaprasadu, N., Chem, J.. Soc. Chem. Commun. 1849 (1998).CrossRefGoogle Scholar
9.Mctcalf, H.C., Williams, J.E., and Caskta, J.F., Modern Chemistry (Holt, Reihart, Winston, New York, 1982), p. 54.Google Scholar
10.Ramli, E., Rauchfuss, T.B., and Stern, C.L., J. Am. Chem. Soc. 112, 4043 (1990).CrossRefGoogle Scholar
11.Dev, S., Ramli, E., Rauchfuss, T.B., and Wilson, S.R., Inorg. Chem. 30, 2514 (1991).CrossRefGoogle Scholar
12.Paul, P.P., Rauchfuss, T.B., and Wilson, S.R., J. Am. Chem. Soc. 115, 3316 (1993).CrossRefGoogle Scholar
13.Henshaw, G., Parkin, I.P., and Shaw, G., J. Chem. Soc. Chem. Commun. 1095 (1996).CrossRefGoogle Scholar
14.Henshaw, G., Parkin, I.P., and Shaw, G., J. Chem. Soc. Dalton Trans. 231 (1997).CrossRefGoogle Scholar
15.Li, Y.D., Ding, Y., and Qian, Y.T., Inorg. Chem. 37, 2344 (1998).Google Scholar
16.Hines, M.A. and Guyot-Sionnest, P., J. Phys. Chem. B102, 3655 (1998).CrossRefGoogle Scholar
17.Murray, C.B., Norris, D.J., and Bawendi, M.G., J. Am. Chem. Soc. 115, 8706 (1993).CrossRefGoogle Scholar
18.Hartmann, H., Mach, R., and Selle, B., Current Topics in Materials Science, edited by Kaldis, E. (North-Holland, New York, 1982), Vol. 9, p. 9.Google Scholar
19.Pashinkin, A.S., Tischenko, G.N., Korneeva, I.V., and Ryzhenko, V.N., Soviet Phys.-Cryst. 5, 243 (1960).Google Scholar
20.Dev, S., Ramli, E., Rauchfuss, T.B., and Stern, C.L., J. Am. Chem. Soc. 122, 6385 (1990).CrossRefGoogle Scholar
21.Verma, A.K., Rauchfuss, T.B., and Wilson, S.R., Inorg. Chem. 34, 3072 (1995).CrossRefGoogle Scholar
22. JCPDS Card No. 15–105.Google Scholar
23.Chestnoy, N., Hull, R., and Brus, L.E., J. Chem. Phys. 85, 2237 (1986).CrossRefGoogle Scholar