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Single-crystal x-ray diffraction from an icosahedral quasicrystal

Published online by Cambridge University Press:  31 January 2011

A. R. Kortan ,
H. S. Chen  and
J. V. Waszczak
A. R. Kortan
Affiliation:
AT&T Bell Laboratories. 600 Mountain Avenue, Murray Hill, New Jersey 07974
H. S. Chen
Affiliation:
AT&T Bell Laboratories. 600 Mountain Avenue, Murray Hill, New Jersey 07974
J. V. Waszczak
Affiliation:
AT&T Bell Laboratories. 600 Mountain Avenue, Murray Hill, New Jersey 07974
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Abstract

Single-crystal x-ray diffraction measurements made on a millimeter-size single icosahedral quasicrystal of an Al–Li–Cu alloy are reported. The point symmetries observed directly by real-time transmission Laue x-ray diffraction and the measured angles between the major symmetry axis are consistent with an icosahedral quasicrystal, and the peaks observed in the single-crystal diffraction scans are found to be indexable with six indices that belong to a primitive icosahedral Bravais quasilattice.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 2 , Issue 3 , June 1987 , pp. 294 - 297
Copyright
Copyright © Materials Research Society 1987

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References

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