Hostname: page-component-f554764f5-sl7kg Total loading time: 0 Render date: 2025-04-17T20:34:49.468Z Has data issue: false hasContentIssue false
  • English
  • Français

Simplified Area Function for Sharp Indenter Tips in Depth-sensing Indentation

Published online by Cambridge University Press:  31 January 2011

Jeremy Thurn  and
Robert F. Cook
Jeremy Thurn
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Robert F. Cook
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Get access

Extract

A two-parameter “area function” characterizing the depth-dependent projected area of an indenter was introduced and applied to a Berkovich tip. The two parameters have physical meaning, corresponding to the effective tip radius and effective cone angle. The indenter tip was calibrated on a commercial load-controlled Nano Indentert® XP (MTS Systems Corp., Eden Prairie, MN). All calibrations were carried out using the procedure of Oliver and Pharr [J. Mater. Res. 7, 1564 (1992)] using several homogeneous materials. Plane-strain modulus and hardness values deconvoluted from indentation load–displacement traces using the calibrated two-parameter area function compared well with the values determined using the empirical eight-parameter area function of Oliver and Pharr.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 5 , May 2002 , pp. 1143 - 1146
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1.Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
2.Enders, S., Grau, P., and Hawthorne, H.M., in Fundamentals of Nanoindentation and Nanotribology II, edited by Baker, S.P., Cook, R.F., Corcoran, S.G., and Moody, N.R. (Mater. Res. Soc. Symp. Proc. 649, Warrendale, PA, 2000), p. Q3.6.Google Scholar
3.Doerner, M.F. and Nix, W.D., J. Mater. Res. 1, 601 (1986).CrossRefGoogle Scholar
4.Herrmann, K., Jennett, N.M., Wegener, W., Meneve, J., Hasche, K., and Seemann, R., Thin Solid Films 377–378, 394 (2000).CrossRefGoogle Scholar
5.Pharr, G.M., Oliver, W.C., and Clarke, D.R., J. Elect. Mater. 19, 881 (1990).CrossRefGoogle Scholar
6.Pharr, G.M., Oliver, W.C., and Harding, D.S., J. Mater. Res. 6, 1129 (1991).CrossRefGoogle Scholar
7.Domnich, V., Gogotsi, Y., and Dub, S., Appl. Phys. Lett. 76, 2214 (2000).CrossRefGoogle Scholar
8.Riester, L., Bridge, R.J., and Breder, K., in Fundamentals of Nanoindentation and Nanotribology, edited by Moody, N.R., Gerberich, W.W., Baker, S.P., and Burnham, N. (Mater. Res. Soc. Symp. Proc. 522, Pittsburgh, PA 1998), p. 45.Google Scholar
9.Bolshakov, A. and Pharr, G.M., J. Mater. Res. 13, 1049 (1998).CrossRefGoogle Scholar
10.Lim, Y.Y. and Chaudhri, M.M., Philos. Mag. A 79, 2979 (1999).CrossRefGoogle Scholar