Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-16T17:01:18.886Z Has data issue: false hasContentIssue false

Role of Pb excess in the crystallization of lead zirconate titanate films derived via sol-gel processing

Published online by Cambridge University Press:  31 January 2011

L. Salamanca-Riba
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, Maryland 20742
Get access

Abstract

Sol-gel spin coating of lead-titanate films differs from most processing routes, such as metalorganic chemical vapor deposition and pulsed laser deposition, in that crystallization cannot occur without a postdeposition annealing step. This work focuses on the annealing of sol-gel-derived PbZrTiO3 films on LaAlO3 substrates in attempts to identify the precise conditions necessary to grow films of quality similar to that obtained through other techniques. In particular, the effects of Pb excess (in precursor solutions), annealing times, and temperature were investigated through transmission electron microscopy and four-circle x-ray diffraction. The significance of this work is in the direct observation of the correlation between Pb excess and film crystallization. It is shown that the effects of Pb excess on the completeness of film crystallization become more dramatic at lower annealing temperatures, even while epitaxial quality is maintained.

Type
Articles
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Moulson, A.J. and Herbert, J.M., Electroceramics (Chapman and Hall, London, U.K., 1990), p. 319.Google Scholar
2.Tuttle, B.A., Voigt, J.A., Goodnow, D.C., Lamppa, D.L., Headley, T.J., Eatough, , Zender, G., Nasby, R.D., and Rodgers, S.M., Am. Ceram. Soc. 76, 1537 (1993).CrossRefGoogle Scholar
3.Voigt, J.A., Tuttle, B.A., Headley, T.J., and Lamppa, D.L., in Ferroelectric Thin Films IV, edited by Desu, S.B., Tuttle, B.A., Ramesh, R., and Shiosaki, T. (Mater. Res. Soc. Symp. Proc. 361, Pittsburgh, PA, 1995), p. 395.Google Scholar
4.Alguero, M., Calzada, M.L., and Pardo, L., J. Mater. Res. 14, 4302 (1999).CrossRefGoogle Scholar
5.Huang, Z., Zhang, Q., and Whatmore, R.W.. J. Appl. Phys. 86, 1662 (1999).CrossRefGoogle Scholar
6.Subodh, G., Ghonge, G., Goo, E., Ramesh, R., Sands, T., and Keramidas, V.G., Appl. Phys. Lett. 63, 1628 (1993).Google Scholar
7.Kim, J.H. and Lange, F.F., J. Mater. Res. 14, 4004 (1999).CrossRefGoogle Scholar
8.Nashimoto, K., Fork, D.K., and Anderson, G.B., Appl. Phys. Lett. 66, 822 (1995).CrossRefGoogle Scholar
9.Hu, H., Peng, C.J., and Krupanidhi, S.B., Thin Solid Films 223, 327 (1993).CrossRefGoogle Scholar
10.Griswold, E.M., Weaver, L., Sayer, M., and Calder, I.D., J. Mater. Res. 10, 3149 (1995).CrossRefGoogle Scholar
11.Madhukar, S., Ph.D. Thesis, University of Maryland, College Park, MD (1998).Google Scholar
12.Aggarwal, S., Madhukar, S., Nagaraj, B., Jenkins, I.G., Ramesh, R., Boyer, L., and Evans, J.T., Jr., Appl. Phys. Lett. 75, 716 (1999).CrossRefGoogle Scholar
13.Dang, E.K.F. and Gooding, R.J., Phys. Rev. Lett. 74, 3848 (1995).CrossRefGoogle Scholar
14.Kumar, C.V.R. Vasant, Sayer, M., Pascual, R., Amm, D.T., Wu, Z., and Swantson, D.M., Appl. Phys. Lett. 58, 1162 (1991).Google Scholar
15.Kumar, C.V.R Vasant, Pascual, R., and Sayer, M., J. Appl. Phys. 71, 864 (1992).CrossRefGoogle Scholar
16.Singh, R., J. Appl. Phys. 63, R59 (1988).CrossRefGoogle Scholar
17.Schwartz, R.W., Xu, Z., Payne, D.A., DeTemple, T.A., and Bradley, M.A.. Ferrolectric Thin Films, edited by Myers, E.R., Kingon, A.I. (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1990), p. 167.Google Scholar
18.Ranganathan, S. and Heimendahl, M. von, J. Mater. Sci. 16, 2401 (1981), M. Avrami, Chem. Phys. 7, 1103 (1939).CrossRefGoogle Scholar
19.Avrami, M., Chem. Phys. 7, 1103 (1939).Google Scholar
20.Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C., Romig, A.D., Jr., C.E. Lyman, C.E. Fiori, and E. Lifshin, Scanning Electron Microscopy and X-ray Microanalysis, 2nd ed. (Plenum Press, Dordrecht, The Netherlands, 1992).CrossRefGoogle Scholar