Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-23T02:35:41.854Z Has data issue: false hasContentIssue false
  • English
  • Français

Rietveld powder structure refinement of Na2Al2Ti6O16; Comparison of synchrotron radiation and conventional x-ray tube datasets

Published online by Cambridge University Press:  31 January 2011

H. Toraya ,
N. Masciocchi  and
W. Parrish
H. Toraya
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120–6099
N. Masciocchi
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120–6099
W. Parrish
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120–6099
Get access

Abstract

The crystal structure of Na2Al2Ti6O16 was refined by the Rietveld method using synchrotron radiation and conventional x-ray powder data, and the agreement factors were Rp = 3.35%, Rwp = 4.30%, and RBragg = 6.39% for synchrotron data. The formula based on the chemical analysis and 16 O atoms is Na1.97Al1.82Ti6.15O16. The crystal data are monoclinic, C2/m, a = 12.1239(3) Å, b = 3.7749(1) Å, c = 6.4180(2) Å, β = 107.59(1)°, V = 280.00(4) Å3, Z = 1, and Dx = 3.82 g cm−3. The site occupancy refinement showed a partial ordering of Al3+ and Ti4+ ions in the two-crystallographically independent octahedral sites.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 7 , July 1990 , pp. 1538 - 1543
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Morgan, P. E. D. and Koutsoutis, M. S., J. Am. Ceram. Soc. 68, C–156 (1985).Google Scholar
2Hori, S. and Watanabe, N., Japanese Patent Agency Report, Sho-64–51331 (1989).Google Scholar
3Andersson, S. and Wadsley, A. D., Acta Crystallogr. 15, 194 (1962).CrossRefGoogle Scholar
4Andersson, S. and Wadsley, A. D., Acta Crystallogr. 15, 201 (1962).Google Scholar
5Bayer, G. and Hoffmann, W., Z. Kristallogr. 121, 9 (1965).Google Scholar
6Mumme, W. G. and Wadsley, A. D., Acta Crystallogr. 23, 754 (1967).Google Scholar
7Ishiguro, T., Tanaka, K., Marumo, F., Ismail, M. G. M. U., and Somiya, S., Acta Crystallogr. B 34, 255 (1978).CrossRefGoogle Scholar
8Parrish, W. and Hart, M., Z. Kristallogr. 179, 161 (1987).Google Scholar
9Toraya, H., J. Appl. Crystallogr. 19, 440 (1986).Google Scholar
10Toraya, H. and Marumo, F., Report Res. Lab. Engin. Mat., Tokyo Inst. of Tech. 5, 55 (1980).Google Scholar
11Caglioti, G., Paoletti, A., and Ricci, F. P., Nucl. Instrum. 3, 223 (1958).Google Scholar
12International Tables for X-ray Crystallography (The Kynoch Press, 1974), Vol. IV.Google Scholar
13Tokonami, M., Acta Crystallogr. 19, 486 (1965).Google Scholar
14Jansen, E., Schäfer, W., and Will, G., J. Appl. Crystallogr. 21, 228 (1988).Google Scholar
15Toraya, H., The Rietveld Method, edited by Young, R. A. (The Oxford University Press, 1990).Google Scholar