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Rapid structural and chemical characterization of ternary phase diagrams using synchrotron radiation

Published online by Cambridge University Press:  03 March 2011

E. D. Specht ,
A. Rar ,
G. M. Pharr ,
E. P. George ,
P. Zschack ,
H. Hong  and
J. Ilavsky
E. D. Specht*
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
A. Rar
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 and Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996
G. M. Pharr
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 and Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996
E. P. George
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 and Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996
P. Zschack
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
H. Hong
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
J. Ilavsky
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A technique based on synchrotron radiation was developed that allows for rapid structural and chemical characterization of ternary alloys over a wide range of composition. The technique was applied to isothermal sections of the Cr–Fe–Ni system grown on Al2O3(0001) sapphire substrates by sequential deposition of layers of graded.thickness followed by annealing to interdiffuse the elements. A film spanning the Cr–Fe–Ni ternary system was measured in 4 h at a resolution of 2 at.% by rastering the sample under a focused beam of synchrotron radiation while simultaneously measuring the diffraction pattern with a charge-coupled device detector to determine crystallographic phases, texture, and lattice parameters and also measuring the x-ray fluorescence with an energy-dispersive detector to determine elemental composition. Maps of phase composition and lattice parameter as a function of composition for several annealing treatments were found to be consistent with equilibrium values. The technique will be useful in combinatorial materials design.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 10 , October 2003 , pp. 2522 - 2527
Copyright
Copyright © Materials Research Society 2003

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References

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