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Pulsed laser deposition of oriented V2O5 thin films

Published online by Cambridge University Press:  31 January 2011

Jeanne M. McGraw ,
John D. Perkins ,
Falah Hasoon ,
Philip A. Parilla ,
Chollada Warmsingh ,
David S. Ginley ,
Eli Mateeva  and
Dennis W. Readey
Jeanne M. McGraw
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401
John D. Perkins
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401
Falah Hasoon
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401
Philip A. Parilla
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401
Chollada Warmsingh
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401
David S. Ginley
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401
Eli Mateeva
Affiliation:
Colorado School of Mines, 1500 Illinois St., Golden, Colorado 80401
Dennis W. Readey
Affiliation:
Colorado School of Mines, 1500 Illinois St., Golden, Colorado 80401
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Abstract

We have found that by varying only the substrate temperature and oxygen pressure five different crystallographic orientations of V2O5 thin films can be grown, ranging from amorphous to highly textured crystalline. Dense, phase-pure V2O5 thin films were grown on SnO2/glass substrates and amorphous quartz substrates by pulsed laser deposition over a wide range of temperatures and oxygen pressures. The films' microstructure, crystallinity, and texturing were characterized by electron microscopy, x-ray diffraction, and Raman spectroscopy. Temperature and oxygen pressure appeared to play more significant roles in the resulting crystallographic texture than did the choice of substrate. A growth map summarizes the results and delineates the temperature and O2 pressure window for growing dense, uniform, phase-pure V2O5 films.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 10 , October 2000 , pp. 2249 - 2265
Copyright
Copyright © Materials Research Society 2000

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