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Preparation of epitaxial SrBi2Nb2O9 and SrBi2Ta2O9 thin films by the coating-pyrolysis process

Published online by Cambridge University Press:  31 January 2011

T. Nagahama ,
T. Manabe ,
I. Yamaguchi ,
T. Kumagai ,
S. Mizuta  and
T. Tsuchiya
T. Nagahama
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1-1, Tsukuba, Ibaraki 305-8565, Japan
T. Manabe
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1-1, Tsukuba, Ibaraki 305-8565, Japan
I. Yamaguchi
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1-1, Tsukuba, Ibaraki 305-8565, Japan
T. Kumagai
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1-1, Tsukuba, Ibaraki 305-8565, Japan
S. Mizuta
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1-1, Tsukuba, Ibaraki 305-8565, Japan
T. Tsuchiya
Affiliation:
Department of Materials Science and Technology, Science University of Tokyo, Yamazaki 2641, Noda, Chiba 278-0022, Japan
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Abstract

Epitaxial and polycrystalline thin films of bismuth layer-structured ferroelectrics, SrBi2Nb2O9 (SBN) and SrBi2Ta2O9 (SBT), were prepared on single-crystal SrTiO3(001) and polycrystalline yttria-stabilized zirconia substrates, respectively, by the coating-pyrolysis process. The epitaxial relationship of the films and substrates was SBN, SBT (001)//SrTiO3(001) and SBN, SBT [100]//SrTiO3[100],[010], where pseudotetragonal indices were adopted for SBN and SBT. The lattices of the epitaxial films were found to be slightly strained owing to stress from the substrate. Atomic force microscopy observations showed that the epitaxial films as well as polycrystalline films consisted of round-shaped, islandlike grains of submicrometer size.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 7 , July 1999 , pp. 3090 - 3095
Copyright
Copyright © Materials Research Society 1999

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