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Polaron conduction loss in microwave dielectric ceramics

Published online by Cambridge University Press:  31 January 2011

Seungbum Hong ,
Eunah Kim ,
Han Wook Song ,
Jongwan Choi ,
Dae-Weon Kim ,
Kwangsoo No ,
Tae-Hong Kim ,
Jung-Rae Park  and
Jin-Woo Han
Seungbum Hong
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea
Eunah Kim
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea
Han Wook Song
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea
Jongwan Choi
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea
Dae-Weon Kim
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea
Kwangsoo No
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea
Tae-Hong Kim
Affiliation:
Electronics and Telecommunications Research Institute, Taejon, 305-701, Korea
Jung-Rae Park
Affiliation:
Electronics and Telecommunications Research Institute, Taejon, 305-701, Korea
Jin-Woo Han
Affiliation:
Electronics and Telecommunications Research Institute, Taejon, 305-701, Korea
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Abstract

It has been generally accepted that the product of the unloaded quality factor and resonant frequency is the universal parameter for comparison of dielectric resonators with different size.1,2 However, it is suggested in this study that this universal parameter should be modified due to the presence of the polarons. From the frequency dependence of the unloaded quality factor, it is possible to extract the factor determined only by the phonon scattering effects, and we denoted this parameter by Qs. It was found that the Qs parameter for ZrxSnzTiyO4 (ZST) and Ba(Zn1/3Ta2/3)O3 (BZT) ceramics showed constancy in the frequency range of 2–12 GHz, which supports the idea of polaron conduction loss contribution to the dielectric loss.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 2 , February 1999 , pp. 500 - 502
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Solomon, S., Sreemoolanadhan, H., Sebastian, M.T., and Mohanan, P., Mater. Lett. 28, 107 (1996).CrossRefGoogle Scholar
2.Takahashi, J., Kageyama, K., and Kodaira, K., Jpn. J. Appl. Phys. 32, 4327 (1993).Google Scholar
3.Wersing, W., Electronic Ceramics, edited by Steele, B.C. H. (Elsevier A.S., London and New York, 1991), pp. 93–99.Google Scholar
4.Kingery, W.D., Bowen, H. K., and Uhlmann, D. R., Introduction to Ceramics (Wiley-Interscience Publication, New York, Chichester, Brisbane, Toronto, 1976), pp. 937–945.Google Scholar
5.Zurmuhlen, R., Petzelt, J., Kamba, S., Voitsekhovskii, V.V., Colla, E., and Setter, N., J. Appl. Phys. 77 (10), 5341 (1995).CrossRefGoogle Scholar
6.Christoffersen, R., Davies, P. K., and Wei, X., J. Am. Ceram. Soc. 77 (6), 1441 (1994).CrossRefGoogle Scholar
7.Barsoum, M.W., Fundamentals of Ceramics (McGraw-Hill, New York, 1997), pp. 219–223.Google Scholar
8.Hench, L.L. and West, J.K., Principles of Electronic Ceramics (Wiley, New York, 1990), p. 93.Google Scholar
9.Kajfez, D. and Guillon, P., Dielectric Resonators (Artech House, Washington, DC, 1986), pp. 341–342.Google Scholar
10.Landau, L.D., Physik Zs. Sow. 3, 644 (1933).Google Scholar
11.Bunget, I. and Popescu, M., Physics of Solid Dielectrics (Elsevier, Amsterdam, Oxford, New York, Tokyo, 1984), pp. 167–183.Google Scholar