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Photoluminescence Spectral Lines Identification in Ho3+-, Er3+-, and Tm3+-doped MgxZn1–xSe Single Crystals

Published online by Cambridge University Press:  31 January 2011

Young-Geun Kim ,
Ho-Jun Song ,
Seok-Kyun Oh ,
Wha-Tek Kim ,
Kwang-Ho Park ,
Duck-Tae Kim ,
Moon-Seog Jin ,
Chang-Dae Kim  and
Chang-Sun Yoon
Young-Geun Kim
Affiliation:
Department of Physics, Chonnam National University, Kwangiu 500–757, Korea
Ho-Jun Song
Affiliation:
Department of Physics, Chonnam National University, Kwangiu 500–757, Korea
Seok-Kyun Oh
Affiliation:
Department of Physics, Chonnam National University, Kwangiu 500–757, Korea
Wha-Tek Kim
Affiliation:
Department of Physics, Chonnam National University, Kwangiu 500–757, Korea
Kwang-Ho Park
Affiliation:
Department of Electronics, Dong-A Junior College, Youngam 526–870, Korea
Duck-Tae Kim
Affiliation:
Department of Electronics, Dong-A Junior College, Youngam 526–870, Korea
Moon-Seog Jin
Affiliation:
Department of Physics, Dongshin University, Naju 520–714, Korea
Chang-Dae Kim
Affiliation:
Department of Physics, Mokpo National University, Mokpo 534–729, Korea
Chang-Sun Yoon
Affiliation:
Department of Physics, Kunsan National University, Kunsan 573–800, Korea
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Abstract

MgxZn1-xSi: Ho3+, MgxZn1-xSe: Er3+, and MgxZn1-xSe: Tm3+ single crystals were grown by the closed-tube sublimation method. The single crystals crystallized into a zincblende structure at the composition x = 0.11 and a wurtzite structure at the composition x = 0.25, 0.32, and 0.41. The trivalent ions (Ho3+, Er3+, and Tm3+) of the rare-earth elements Ho, Er, and Tm site in Td and C3v symmetries in the single crystals with zincblende and wurtzite structures, respectively. Sharp emission peaks appeared in the photoluminescence spectra of the single crystals. These emission peaks are identified to originate from the radiation recombination between the energy levels of the trivalent ions sited in Td and C3v symmetries.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 4 , April 1999 , pp. 1227 - 1234
Copyright
Copyright © Materials Research Society 1999

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References

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