Article contents
Photoassisted oxygen doping of C60 films
Published online by Cambridge University Press: 03 March 2011
Abstract
C60 films simultaneously exposed at T = 300 K to oxygen and visible-ultraviolet light are found to exhibit rapid diffusion of oxygen into the deep bulk of the film. The diffusion rate is found to be ∼10 times faster in the presence of light. Vibrational and optical absorption spectroscopy indicate that the photoassisted reaction of O2 with solid C60 involves two coupled reactions: (i) the photoassisted diffusion of molecular oxygen into solid C60 and (ii) oxidation of C60.
- Type
- Articles
- Information
- Copyright
- Copyright © Materials Research Society 1993
References
REFERENCES
1Kroto, H. W., Heath, J. R., O'Brien, S. C., Curl, R. F., and Smalley, R. E., Nature 318, 162 (1985).CrossRefGoogle Scholar
4Selig, H., Lifshitz, C., Peres, T., Fischer, J. E., McGhie, A. R., Romanow, W. J., McCauley, J. P., and Smith, A. B. I., J. Am. Chem. Soc. 113, 5475 (1991).CrossRefGoogle Scholar
5Bausch, J. W., Prakash, G. K. S, Olah, G. A., Tse, D. S., Lorents, D. C., Bae, Y. K., and Malhotra, R., J. Am. Chem. Soc. 113, 3205 (1991).CrossRefGoogle Scholar
6Hawkins, J. M., Loren, S., Meyer, A., and Nunlist, R., J. Am. Chem. Soc. 113, 7770 (1991).CrossRefGoogle Scholar
7Hawkins, J. M., Meyer, A., Lewis, T. A., Loren, S., and Hollander, F. J., Science 252, 312 (1991).CrossRefGoogle Scholar
9Fagan, P. J., Calabrese, J. C., and Malone, B., Accounts of Chemical Research 25, 134 (1992).CrossRefGoogle Scholar
10Taylor, R., Parsons, J. P., Avent, A. G., Rannard, S. P., Dennis, T. J., Hare, J. P., Kroto, H. W., and Walton, D. R. M., Nature 351, 277 (1991).CrossRefGoogle Scholar
11Kroll, G. H., Benning, P. J., Chen, Y., Ohno, T. R., Weaver, J. H., Chibante, L. P. F., and Smalley, R. E., Chem. Phys. Lett. 181, 112 (1991).CrossRefGoogle Scholar
12Creegan, K. M., Robins, J. L., Robbins, W. K., Millar, J. M., Sherwood, R. D., Tindall, P. J., Cox, D. M., Smith, A. B. III, McCauley, J. P. Jr., Jones, D. R., and Gallagher, R. T., J. Am. Chem. Soc. 114, 1103 (1992).CrossRefGoogle Scholar
13Elemes, Y., Silverman, S. K., Sheu, C., Kao, M., Foote, C. S., Alvarez, M. M., and Whetten, R. L., Angew. Chem. Int. Ed. Engl. 31, 351 (1992).CrossRefGoogle Scholar
14Vassallo, A. M., Pang, L. S., Cole-Clark, P. A., and Wilson, M. A., J. Am. Chem. Soc. 113, 7820 (1991).CrossRefGoogle Scholar
15Taliani, C., Ruani, G., Zamboni, R., Danieli, R., Rossini, S., Denisov, V. N., Burlakov, V. M., Negri, F., Orlandi, G., and Zerbetto, F., J. Chem. Soc, Chem. Commun. 3, 220 (1993).CrossRefGoogle Scholar
16Diederich, F., Ettl, R., Rubin, Y., Whetten, R. L., Beck, R., Alvarez, M., Anz, S., Sensharma, D., Wudl, F., Khemani, K. C., and Koch, A., Science 252, 548 (1991).CrossRefGoogle Scholar
17Arai, T., Murakami, Y., Suematsu, H., Kikuchi, K., Achiba, Y., and Ikemoto, I., Solid State Commun. 84, 827 (1992).CrossRefGoogle Scholar
18Haufler, R. E., Conceicao, J., Chibante, L. P. F, Chai, Y., Byrne, N. E., Flanagan, S., Haley, M. M., O'Brien, S. C., Pan, C., Xiao, Z., Billups, W. E., Ciufolini, M. A., Hauge, R. H., Margrave, J. L., Wilson, L. J., Curn, R. F., and Smalley, R. E., J. Phys. Chem. 94, 8634 (1990).CrossRefGoogle Scholar
20Zhou, P., Rao, A. M., Wang, K-A., Robertson, J. D., Eloi, C., Meier, M. S., Ren, S. L., Bi, X-X., and Eklund, P. C., Appl. Phys. Lett. 60, 2871 (1992).CrossRefGoogle Scholar
21Eloi, C. C., Robertson, J. D., Rao, A. M., Zhou, P., Wang, K-A. and Eklund, P.C., unpublished research.Google Scholar
22Wang, K-A., Wang, Y., Zhou, P., Holden, J. M., Ren, S. L., Hager, T., Ni, H. F., Eklund, P. C., Dresselhaus, G., and Dresselhaus, M. S., Phys. Rev. B 45, 1955 (1992).CrossRefGoogle Scholar
23Zhou, P., Wang, K-A., Wang, Y., Eklund, P. C., Dresselhaus, M. S., and Dresselhaus, G., Phys. Rev. B 46, 2595 (1992).CrossRefGoogle Scholar
24Eklund, P. C., Zhou, P., Wang, K-A., Dresselhaus, G., and Dresselhaus, M. S., J. Phys. Chem. Solids 53, 1391 (1992).CrossRefGoogle Scholar
25Ren, S. L., Wang, Y., Rao, A. M., McRae, E., Holden, J. M., Hager, T., Wang, K-A., Lee, W-T., Ni, H. F., Selegue, J. P., and Eklund, P. C., Appl. Phys. Lett. 59, 2678 (1991).CrossRefGoogle Scholar
26Dresselhaus, G., Dresselhaus, M. S., and Eklund, P. C., Phys. Rev. B 45, 6923 (1992).CrossRefGoogle Scholar
27Rao, A. M., Wang, Y., Ren, S. L., Lehman, G. W., and Eklund, P. C., unpublished research.Google Scholar
28Rao, A .M., Zhou, P., Wang, K-A., Hager, G. T., Holden, J. M., Wang, Y., Lee, W-T., Bi, X-X., Eklund, P. C., Cornett, D. S., Duncan, M. A., and Amster, I. J., Science 259, 955 (1993).CrossRefGoogle Scholar
29Duclos, S. J., Haddon, R. C., Glarum, S. H., and Lyons, K. B., Solid State Commun. 80, 481 (1991).CrossRefGoogle Scholar
31Pichler, T., Matus, M., Kürti, J., and Kuzmany, H., Phys. Rev. B 45, 13841 (1992).CrossRefGoogle Scholar
32Kratschmer, W., Lamb, L. D., Fostiropoulos, K., and Huffman, D. R., Nature 347, 354–358 (1990).CrossRefGoogle Scholar
33Meijer, G., Bethune, D. S., Tang, W. C., Rosen, H. J., Johnson, R. D., Wilson, R. J., Chambliss, D. D., Golden, W. G., Seki, H., Devries, M. S., Brown, C. A., Salem, J. R., Huniker, H. E., and Wendt, H. R., in Clusters and Cluster-Assembled Materials, edited by Averback, R. S., Bernholc, J., and Nelson, D. L. (Mater. Res. Soc. Symp. Proc. 206, Pittsburgh, PA, 1991), p. 619.Google Scholar
34Assink, R. A., Schirber, J. E., Loy, D. A., Morosin, B., and Carlson, G. A., J. Mater. Res. 7, 2136 (1992).CrossRefGoogle Scholar
35Nissen, M. K., Wilson, S. M., and Thewalt, M. L. W., Phys. Rev. Lett. 69, 2423 (1992).CrossRefGoogle Scholar
36Arbogast, J. W., Darmanyan, A. P., Foote, C. S., Rubin, R., Diederich, F. N., Alvarez, M. M., Anz, S. J., and Whetten, R. L., J. Phys. Chem. 95, 11 (1991).CrossRefGoogle Scholar
37A true clathrate is a compound in which there is no apparent electronic interaction between constituents. See, e.g., C6o(C5Hi2)o.88(C7H8)o.o5 described by Kamaras et al, Chem. Phys. Lett. (1993, in press).Google Scholar
38Dresselhaus, M. S., Dresselhaus, G., and Eklund, P. C., J. Mater. Res. 8, 2054 (1993).CrossRefGoogle Scholar
39Wang, Y., Holden, J. M., Rao, A. M., Lee, W-T., Bi, X-X., Ren, S. L., Lehman, G. W., Hager, G. T., and Eklund, P. C., Phys. Rev. B 45, 14396 (1992).CrossRefGoogle Scholar
- 52
- Cited by