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Oxygen content, microstructure, and superconductivity of YBa2Cu3O7−x

Published online by Cambridge University Press:  31 January 2011

M. P. A. Viegers
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
D. M. de Leeuw
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
C. A. H. A. Mutsaers
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
H. A. M. van Hal
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
H. C. A. Smoorenburg
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
J. H. T. Hengst
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
J. W. C. de Vries
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
P. C. Zalm
Affiliation:
Philips Research Laboratory, P. O. Box 80.000, 5600 JA Eindhoven, The Netherlands
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Abstract

The influence of preparation conditions and microstructure on the superconductive properties of single-phase poly-crystalline YBa2Cu3O7−x was investigated by electron probe microanalysis, transmission electron microscopy (TEM), and x-ray powder diffraction as a function of temperature in various ambients supplemented by resistivity and susceptibility measurements. Leaching of Ba was observed when samples were brought in contact with water. The TEM imaging revealed that individual grains have an extremely defect-rich outer shell and an inner core with a domain structure with a and b axes interchanged. The transition temperature Tc was found to decrease with increasing quench temperature in the range 400–900°C. The Tc was observed to be linearly proportional to the difference in the orthorhombic cell parameters (b-a). Further implications are discussed.

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Articles
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1Bendorz, J. G. and Muller, K. A., Z. Phys. B 64, 189 (1986).Google Scholar
2Without the intention to discredit other important contributions, we address the interested reader to the special sections with numerous papers on high-Tc materials that appeared in the 1 April 1987 issue of Phys. Rev. B and the April and May 1987 issues of Jpn. J. Appl. Phys. Lett.Google Scholar
3Takeda, S. and Hikami, S., Jpn. J. Appl. Phys. 26, L848 (1987).CrossRefGoogle Scholar
4Capponi, J. J., Chaillout, C., Hewat, A. W., Lejay, P., Marezio, M., Nguyen, N., Raveau, B., Soubeyroux, J. L., Tholence, J. L., and Tour-nier, R., Europhys. Lett. 3, 1301 (1987); F. Izumi, H. Asano, T. Ishi-gaki, E. Takayama-Muromachi, Y. Uchida, N. Watanabe, and T. Nishikawa, Jpn. J. Appl. Phys. 26, L649 (1987); M. A. Beno, L. Soderholm, D. W. Capone, D. G. Hinks, J. D. Jorgensen, I. K. Schuller, C. U. Segre, K. Zhang, and J. D. Grace, Appl. Phys. Lett. 51, 57 (1987); J. E. Greedan, A. M. O'Reilly, andC. V. Stager, Phys. Rev. B 35, 8770 (1987); W. I. F. David, W. T. A. Harrison, J. M. F. Gunn, O. Moze, A. K. Stoper, P. Day, J. D. Jorgensen, D. G. Hinks, M. A. Beno, L. Soderholm, D. W. Capone, I. K. Schuller, C. U. Segre, K. Zhang, and J. D. Grace, Nature 327, 310 (1987).CrossRefGoogle Scholar
5Jorgensen, J. D. (private communication).Google Scholar
6Schuller, I. K., Hinks, D. G., Beno, M. A., Capone, D. W., Soder-holm, L., Locquet, J. P., Bruynserade, Y., Segre, C. U., and Zhang, K., Solid State Commun. 63, 385 (1987); K. Yukino, T. Sato, S. Ooba, M. Ohta, F. P. Okamura, and A. Ono, Jpn. Appl. Phys. 26, L869 (1987).CrossRefGoogle Scholar
7Berg, J. v. d., Beek, C. J. v. d., Kes, P. H., Nieuwenhuys, G. J., Mydosh, J. A., Zandbergen, H. W., Berkel, F. P. F. v., Steens, R., and Ijdo, D. J. W., Europhys. Lett. 4, 737 (1987).CrossRefGoogle Scholar
8Kubo, Y., Yoshitake, T., Tabuchi, J., Nakabayashi, Y., Ochi, A., Utsumi, K., Igarashi, H., and Yonezawa, M., Jpn. J. Appl. Phys. 26, L768 (1987).CrossRefGoogle Scholar