Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-20T04:22:36.873Z Has data issue: false hasContentIssue false

The oxidation of an aluminum nitride powder studied by bremsstrahlung-excited Auger electron spectroscopy and x-ray photoelectron spectroscopy

Published online by Cambridge University Press:  03 March 2011

Pu Sen Wang
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Subhas G. Malghan
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Stephen M. Hsu
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Thomas N. Wittberg
Affiliation:
University of Dayton Research Institute, Dayton, Ohio 45469
Get access

Abstract

Bremsstrahlung-excited Auger electron spectroscopy (AES) was used to study the oxidation kinetics of an aluminum nitride powder oxidized in air at 750, 800, 850, and 900 °C. An equation was derived to calculate the average surface oxide film thickness from the aluminum AES spectra. The oxidation of this powder was found to follow a parabolic rate law within this temperature range. The measured activation energy was 230 ± 17 kJ/mol (55 ± 4 kcal/mol). Analysis with x-ray photoelectron spectroscopy (XPS) showed that in addition to the nitride N 1s peak, there was a second N 1s peak. This peak has been observed in previous studies and can be attributed to N-O bonding either within the growing oxide film or at the Al2O3/AlN interface.

Type
Articles
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Katnani, A. D. and Papathomas, K. I., J. Vac. Sci. Technol. A 5, 1335 (1987).CrossRefGoogle Scholar
2Barthelme, P., Ansorge, F., Kulig, M., Hoffman, T., and Russel, C., Euro-Ceramics 1, Processing of Ceramics, edited by de With, G.et al. (Elsevier Applied Science, New York, 1989).Google Scholar
3Dupuie, J. L. and Gulari, E., J. Vac. Sci. Technol. A 10, 18 (1992).CrossRefGoogle Scholar
4Liao, H. M., Sodhi, R. N. S., and Coyle, T. W., J. Vac. Sci. Technol. A 11, 2681 (1993).CrossRefGoogle Scholar
5Wang, P. S., Hsu, S. M., Malghan, S. G., and Wittberg, T. N., J. Mater. Sci. 26, 3249 (1991).CrossRefGoogle Scholar
6Wang, P. S., Malghan, S. G., Hsu, S. M., and Wittberg, T. N., J. Mater. Res. 8, 3168 (1993).CrossRefGoogle Scholar
7Wang, P. S., Malghan, S. G., Hsu, S. M., and Wittberg, T. N., Surface and Interface Analysis 21, 155 (1994).Google Scholar
8Wang, P. S., Hsu, S. M., and Wittberg, T. N., J. Mater. Sci. 26, 1655 (1991).CrossRefGoogle Scholar
9Wang, P. S., Malghan, S. G., Hsu, S. M., and Wittberg, T. N., Surface and Interface Analysis 18, 159 (1992).CrossRefGoogle Scholar
10Wang, P. S., Malghan, S. G., Hsu, S. M., and Wittberg, T. N., Surface and Interface Analysis 20, 105 (1993).CrossRefGoogle Scholar
11Certain commercial equipment, instruments, or materials are identified in this paper in order to specify adequately the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
12Press, W. H., Flannery, B. P., Teukolsky, S. A., and Vetterling, W. T., Numerical Recipes (Cambridge University Press, New York, 1987), pp. 400, 407420, 523528.Google Scholar
13Shirley, D. A., Phys. Rev. B 5, 4709 (1972).CrossRefGoogle Scholar
14Strohmeier, B. R., Surface and Interface Analysis 15, 51 (1990).CrossRefGoogle Scholar
15Tanuma, S., Powell, C. J., and Penn, D. R., Surface and Interface Analysis 17, 927 (1991).CrossRefGoogle Scholar
16Handbook of Chemistry and Physics, 70th ed. edited by Weast, R. C. (Chemical Rubber, Boca Raton, FL, 1989), p. B-68.Google Scholar
17Pantano, C. G. Jr., private communication.Google Scholar