Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-27T01:46:04.315Z Has data issue: false hasContentIssue false
  • English
  • Français

On the use of ion scattering to examine the role of hydrogen in the reduction of TiO2

Published online by Cambridge University Press:  31 January 2011

W.E. Wallace ,
Q. Zhong ,
J. Genzer ,
R.J. Composto  and
D.A. Bonnell
W.E. Wallace
Affiliation:
Department of Materials Science and Engineering, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
Q. Zhong
Affiliation:
Department of Materials Science and Engineering, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
J. Genzer
Affiliation:
Department of Materials Science and Engineering, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
R.J. Composto
Affiliation:
Department of Materials Science and Engineering, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
D.A. Bonnell
Affiliation:
Department of Materials Science and Engineering, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
Get access

Abstract

Rutherford backscattering spectrometry (RBS) was used to measure the titanium concentration profile for hydrogen-reduced, vacuum-reduced, and as-received, stoichiometric rutile. These profiles give the degree of reduction, specifically, the extent of oxygen deficiency, as a function of depth below the sample surface. Using forward-recoil spectrometry (FRES), the hydrogen-reduced rutile was found to contain more bulk and near-surface hydrogen than the as-received, stoichiometric rutile. This observation provides additional evidence for a hydrogen-diffusion model for the reduction of rutile in a hydrogen environment.

Type
Articles
Information
Journal of Materials Research , Volume 8 , Issue 7 , July 1993 , pp. 1629 - 1634
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Finklea, H. O. in Studies in Physical and Theoretical Chemistry, edited by Finklea, H. O. (Elsevier, Amsterdam, 1988).Google Scholar
2Henrich, V. E. and Kurtz, R. L.Phys. Rev. B23, 6280 (1981).Google Scholar
3Kofstad, R.Non-Stoichiometry, Diffusion, and Electrical Conductivity in Binary Metal Oxides (John Wiley and Sons, New York, 1972).Google Scholar
4Rohrer, G. S.Henrich, V. E. and Bonnell, D. A.Science 250, 1239 (1990).Google Scholar
5Zhong, Q.Vohs, J.M. and Bonnell, D.A.Surf. Sci. 274, 35 (1992).CrossRefGoogle Scholar
6Zhong, Q.Vohs, J. M. and Bonnell, D. A.J. Am. Ceram. Soc. (1993, in press).Google Scholar
7Bird, J. R. and Williams, J. S.Ion Beams for Materials Analysis (Academic Press, New York, 1989).Google Scholar
8Iwaki, M.Okabe, Y. and Yabe, K.Nucl. Instrum. Methods B45, 212 (1990).Google Scholar
9Baumann, S. M.Mariner, C. C.Martin, D. W.Blattner, R. J. and Braundmeier, A. J. Jr. , Nucl. Instrum. Methods B45, 664 (1990).Google Scholar
10Chu, W-K.Mayer, J. W. and Nicolet, M-A.Backscattering Spec-trometry (Academic Press, Orlando, FL, 1978).Google Scholar
11Doolittle, L.R.Nucl. Instrum. Methods B9, 334 (1985).Google Scholar
12Bursill, L.A. and Hyde, B.G.Prog. Solid State Chem. 7, 177 (1972).CrossRefGoogle Scholar
13Tirira, J.Trocellar, P.Frontier, J. P. and Trouslard, P.Nucl. Instrum. Methods B45, 203 (1990).Google Scholar
14Johnson, O.W.Paek, S-H. and DeFord, J.W.J. Appl. Phys. 46, 1026 (1975).Google Scholar