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Nonlinear optical properties of Bi1.95La1.05TiNbO9 ferroelectric film grown on fused quartz substrates by PLD

Published online by Cambridge University Press:  19 April 2011

Zhuoyu Huo ,
Junhe Han  and
Yuzong Gu
Zhuoyu Huo
Affiliation:
Institute of Micro-system Physics, Key Laboratory of Photovoltaic Materials of Henan Province and School of Physics & Electronics, Henan University, Kaifeng 475004, People’s Republic of China
Junhe Han
Affiliation:
Institute of Micro-system Physics, Key Laboratory of Photovoltaic Materials of Henan Province and School of Physics & Electronics, Henan University, Kaifeng 475004, People’s Republic of China
Yuzong Gu*
Affiliation:
Institute of Micro-system Physics, Key Laboratory of Photovoltaic Materials of Henan Province and School of Physics & Electronics, Henan University, Kaifeng 475004, People’s Republic of China
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Bi1.95La1.05TiNbO9 (BLTN-1.05) thin films were prepared on fused quartz substrates by pulsed laser deposition. The x-ray diffraction (XRD) analysis and atomic force microscope (AFM) surface morphology measurements were performed on the samples. The XRD pattern demonstrated that the films are single-phase perovskite structured and well crystallized. The AFM analysis indicated that the films have less rough surface. The fundamental optical constants were obtained through optical transmittance measurements. The nonlinear optical properties of BLTN thin films were measured by a single beam Z-scan technique under 1064 nm excitation. The real and imaginary parts of the third-order nonlinear optical susceptibility χ(3) of the film were measured to be 9.56 × 10−9 and −3.67 × 10−9 esu, respectively. The Z-scan results show that BLTN thin films have potential applications in nonlinear optics.

Keywords

Optical propertiesFerroelectricFilm
Type
Articles
Information
Journal of Materials Research , Volume 26 , Issue 9 , 14 May 2011 , pp. 1159 - 1163
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1.Pardo, L., Castro, A., Millan, P., Alemany, C., Jimenez, R., and Jimenez, B.: (Bi3TiNbO9)x(SrBi2Nb2O9)1−x aurivillius type structure piezoelectric ceramics obtained from mechanochemically activated oxides. Acta Mater. 48, 2421 (2000).CrossRefGoogle Scholar
2.Hong, S.H., Mckinstry, S.T., and Messing, G.L.: Electromechanical properties of textured niobium-doped bismuth titanate ceramics. J. Am. Ceram. Soc. 83, 113 (2000).CrossRefGoogle Scholar
3.Park, B.H., Kang, B.S., Bu, S.D., Noh, T.W., Lee, J., and Jo, W.: Lanthanum-substituted bismuth titanate for use in non-volatile memories. Nature 401, 682 (1999).CrossRefGoogle Scholar
4.Araujo, C.A.P.D., Cuchiaro, J.D., McMillan, L.D., Scott, M.C., and Scott, J.F.: Fatigue-free ferroelectric capacitors with platinum electrodes. Nature 374, 627 (1995).CrossRefGoogle Scholar
5.Kim, S.K., Miyayama, M., and Yanagida, H.: Electrical anisotropy and a plausible explanation for dielectric anomaly of Bi4Ti3O12 single crystal. Mater. Res. Bull. 31, 121 (1996).CrossRefGoogle Scholar
6.Zhou, Z.Y., Dong, X.L., and Yan, H.X.: Lanthanum distribution and dielectric properties of Bi3−xLaxTiNbO9 bismuth layer-structured ceramics. Scr. Mater. 55, 791 (2006).CrossRefGoogle Scholar
7.Zhang, M.F., Yang, B., Chen, H.Z., and Cao, W.W.: Optical properties of Bi2.25La0.75TiNbO9 thin films grown on fused silica substrates by PLD. Opt. Mater. 32, 406 (2009).CrossRefGoogle Scholar
8.Zhang, M.F., Chen, H.Z., Yang, B., and Cao, W.W.: Investigation on optical properties of Bi2.85La0.15TiNbO9 thin films by prism coupling technique. Appl. Phys. A Mater. Sci. Process. 97, 741 (2009).CrossRefGoogle Scholar
9.Chen, H.Z., Yang, B., Zhang, M.F., Wang, F.Y., Cheah, K., and Cao, W.W.: Third-order optical nonlinear absorption in Bi1.95La1.05TiNbO9 thin films. Thin Solid Films 518, 5585 (2010).CrossRefGoogle Scholar
10.Sheik-Bahae, M., Said, A.A., Wei, T.H., Hagan, D.J., and VanStryland, E.W.: Sensitive measurement of optical nonlinearities using a single beam. IEEE J. Quantum Electron 26, 760 (1990).CrossRefGoogle Scholar
11.Chen, K.S., Gu, H.H., Cai, Y.X., Xiong, J., and Wang, A.M.: Fe/SrBi2Nb2O9 composite thin films with large third-order optical nonlinearities. J. Alloy. Comp. 476, 635 (2009).CrossRefGoogle Scholar
12.Mor, G.K., Varghese, O.K., Paulose, M., Shankar, K., and Grimes, C.A.: A review on highly ordered, vertically oriented TiO2 nanotube arrays: Fabrication, material properties, and solar energy applications. Sol. Energy Mater. Sol. Cells 90, 2011 (2006).CrossRefGoogle Scholar
13.Du, Y., Zhang, M.S., Wu, J., Kang, L., Yang, S., Wu, P., and Yin, Z.: Optical properties of SrTiO3 thin film by pulsed laser deposition. Appl. Phys. A Mater. Sci. Process. 76, 1105 (2003).CrossRefGoogle Scholar
14.Zhang, T., Zhang, W.F., Chen, Y.H., and Yin, J.: Third-order optical nonlinearities of lead-free (Na1-xKx)0.5Bi0.5TiO3 thin films. J. Opt. Commun. 281, 439 (2008).CrossRefGoogle Scholar
15.Prakash, G.V., Cazzanelli, M., Gaburro, Z., Pavesi, L., Iacona, F., Franzo, G., and Priolo, F.: Nonlinear optical properties of silicon nanocrystals grown by plasma-enhanced chemical vapor deposition. J. Appl. Phys. 91, 4607 (2002).CrossRefGoogle Scholar
16.Shi, P., Yao, X., Zhang, L.Y., Wu, X.Q., Wang, M.Q., and Wan, X.: Third-order optical nonlinearity of (Ba0.7Sr0.3)TiO3 ferroelectric thin films fabricated by soft solution processing. Solid State Commun. 134, 589 (2005).CrossRefGoogle Scholar
17.Wang, C.X., Fu, S.S., and Gu, Y.Z.: Large third-order optical nonlinearity of cadmium sulphide nanoparticles embedded in polymer thin film. Chin. Phys. Lett. 26, 097804 (2009).Google Scholar
18.Yin, M., Li, H.P., Tang, S.H., and Ji, W.: Determination of nonlinear absorption and refraction by single Z-scan method. Appl. Phys. B 70, 587 (2000).CrossRefGoogle Scholar
19.Li, H.P., Kam, C.H., Lam, Y.L., and Ji, W.: Femtosecond Z-scan measurements of nonlinear refraction in nonlinear optical crystals. Opt. Mater. 15, 237 (2001).CrossRefGoogle Scholar