Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Keller, R. R.
Phelps, J. M.
and
Read, D. T.
1994.
Tensile Deformation-Induced Microstructures in Freestanding Copper Thin Films.
MRS Proceedings,
Vol. 338,
Issue. ,
Schen, Michael A.
Davis, G. T.
Mopsik, F. I.
Wu, W. L.
Wallace, W. E.
Manning, Jr.
Handwerker, C. A.
and
Read, D. T.
1995.
Electronics Packaging Materials Research at NIST.
MRS Proceedings,
Vol. 390,
Issue. ,
Heinen, D.
Bohn, H. G.
and
Schilling, W.
1995.
On the mechanical strength of free-standing and substrate-bonded Al thin films.
Journal of Applied Physics,
Vol. 77,
Issue. 8,
p.
3742.
Read, David T.
and
Dally, James W.
1995.
Fatigue of Microlithographically-Patterned Free-Standing Aluminum Thin Film Under Axial Stresses.
Journal of Electronic Packaging,
Vol. 117,
Issue. 1,
p.
1.
Keller, R.R
Phelps, J.M
and
Read, D.T
1996.
Tensile and fracture behavior of free-standing copper films.
Materials Science and Engineering: A,
Vol. 214,
Issue. 1-2,
p.
42.
Wan Suwito
Dunn, M.L.
and
Cunningham, S.J.
1997.
Mechanical behavior of structures for microelectromechanical systems.
Vol. 1,
Issue. ,
p.
611.
Ma, Dejun
Xu, Kewei
and
He, Jiawen
1998.
Numerical simulation for determining the mechanical properties of thin metal films using depth-sensing indentation technique.
Thin Solid Films,
Vol. 323,
Issue. 1-2,
p.
183.
Petersen, DR
and
Read, DT
1998.
Piezo-Actuated Microtensile Test Apparatus.
Journal of Testing and Evaluation,
Vol. 26,
Issue. 3,
p.
255.
Read, D. T.
1998.
Silicon-Framed Tensile Specimens: Techniques and Results.
MRS Proceedings,
Vol. 518,
Issue. ,
Suwito, Wan
Dunn, Martin L.
Cunningham, Shawn J.
and
Read, David T.
1999.
Elastic moduli, strength, and fracture initiation at sharp notches in etched single crystal silicon microstructures.
Journal of Applied Physics,
Vol. 85,
Issue. 7,
p.
3519.
Jayaraman, S.
Edwards, R. L.
and
Hemker, K. J.
1999.
Relating mechanical testing and microstructural features of polysilicon thin films.
Journal of Materials Research,
Vol. 14,
Issue. 3,
p.
688.
Pancewicz, Tomasz
Jachowicz, Ryszard
Gniazdowski, Zenon
Ażgin, Zbigniew
and
Kowalski, Paweł
1999.
The empirical verification of the FEM model of semiconductor pressure sensor.
Sensors and Actuators A: Physical,
Vol. 76,
Issue. 1-3,
p.
260.
Ma, Dejun
Xu, Kewei
He, Jiawen
and
Lu, Jian
1999.
Evaluation of the mechanical properties of thin metal films.
Surface and Coatings Technology,
Vol. 116-119,
Issue. ,
p.
128.
Volinsky, A.A.
Vella, J.
Adhihetty, I.S.
Sarihan, V.
Mercado, L.
Yeung, B.H.
and
Gerberich, W.W.
2000.
Microstructure and Mechanical Properties of Electroplated Cu Thin Films.
MRS Proceedings,
Vol. 649,
Issue. ,
Lee, Hoo-Jeong
Cornella, Guido
and
Bravman, John C.
2000.
Stress relaxation of free-standing aluminum beams for microelectromechanical systems applications.
Applied Physics Letters,
Vol. 76,
Issue. 23,
p.
3415.
Poilane, C.
Lantz, E.
Tribillon, G.
and
Delobelle, P.
2000.
Measurement of in-plane displacement fields by a spectral phase algorithm applied to numerical speckle photograph for microtensile tests.
The European Physical Journal Applied Physics,
Vol. 11,
Issue. 2,
p.
131.
Sharpe, WN
Jackson, KM
Coles, G
Eby, MA
and
Edwards, RL
2001.
Mechanical Properties of Structural Films.
p.
229.
Kraft, O.
2001.
Encyclopedia of Materials: Science and Technology.
p.
9257.
Read, David T
Cheng, Yi-Wen
Keller, Robert R
and
McColskey, J.David
2001.
Tensile properties of free-standing aluminum thin films.
Scripta Materialia,
Vol. 45,
Issue. 5,
p.
583.
Sharpe, W. N.
and
Hemker, K. J.
2001.
Mechanical Testing of Free-Standing Thin Films.
MRS Proceedings,
Vol. 697,
Issue. ,