Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Pappas, David L.
Hrubowchak, David M.
Ervin, Matthew H.
and
Winograd, Nicholas
1989.
Atom Counting at Surfaces.
Science,
Vol. 243,
Issue. 4887,
p.
64.
Friedbacher, G.
Virag, A.
Grasserbauer, M.
Wilhartitz, P.
and
Ortner, H. M.
1989.
Quantitative ultratrace distribution analysis of tantalum wires with SIMS.
Fresenius' Zeitschrift f�r Analytische Chemie,
Vol. 335,
Issue. 7,
p.
675.
Grasserbauer, M.
Stingeder, G.
Friedbacher, G.
and
Virag, A.
1989.
Quantitative trace analysis of technical materials with solid state mass spectrometry: An analytical strategy for SIMS.
Surface and Interface Analysis,
Vol. 14,
Issue. 10,
p.
623.
Grasserbauer, M.
1989.
The challenge of high technology for analytical chemistry.
TrAC Trends in Analytical Chemistry,
Vol. 8,
Issue. 6,
p.
192.
Grasserbauer, M
and
Stingeder, G
1989.
Secondary ion mass spectrometry (SIMS) of silicon.
Vacuum,
Vol. 39,
Issue. 11-12,
p.
1077.
Grasserbauer, M
1989.
Surface and interface analysis for the development of VLSI devices.
Thin Solid Films,
Vol. 181,
Issue. 1-2,
p.
17.
1990.
Elemental trace analysis of surfaces and interfaces: goals, accomplishments and challenges.
Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences,
Vol. 333,
Issue. 1628,
p.
113.
1990.
Atomic Spectrometry Update—References.
J. Anal. At. Spectrom.,
Vol. 5,
Issue. 7,
p.
278R.
Grasserbauer, M.
and
Stingeder, G.
1990.
The challenge of microelectronics for analytical chemistry.
Fresenius' Journal of Analytical Chemistry,
Vol. 337,
Issue. 6,
p.
701.
Wilhartitz, Peter
Ortner, Hugo M.
Krismer, Robert
and
Krabichler, Hermann
1990.
Classical analysis including trace-matrix separation versus solid state mass spectrometry: A comparative study for the analysis of high purity Mo, W and Cr.
Mikrochimica Acta,
Vol. 101,
Issue. 1-6,
p.
259.
Ortner, Hugo M.
and
Wilhartitz, Peter
1990.
Ultratrace and microdistribution analysis in material sciences.
Fresenius' Journal of Analytical Chemistry,
Vol. 337,
Issue. 6,
p.
686.
Wilhartitz, Peter
and
Ortner, Hugo M.
1991.
Bulk trace and distribution analysis in refractory and hard metals. examples from research and development and applications in quality assurance.
Fresenius' Journal of Analytical Chemistry,
Vol. 341,
Issue. 1-2,
p.
125.
Ortner, Hugo M.
1992.
Ultratrace analysis ? Facts and fiction.
Fresenius' Journal of Analytical Chemistry,
Vol. 343,
Issue. 9-10,
p.
695.
Zadgorska, Z.
Wallura, E.
and
Nickel, H.
1993.
Contribution to the clarifying of the action of thermochemical additives on the modification of a matrix silicon carbide using scanning electron microscopy and energy dispersive X-ray analysis.
Fresenius' Journal of Analytical Chemistry,
Vol. 346,
Issue. 1-3,
p.
334.
Battagliarin, M.
Sentimenti, E.
and
Scattolin, R.
1995.
An innovative sample preparation procedure for trace and ultra-trace analysis on non-conducting powders by direct current glow discharge mass spectrometry.
Spectrochimica Acta Part B: Atomic Spectroscopy,
Vol. 50,
Issue. 1,
p.
13.
Becker, Johanna Sabine
and
Dietze, Hans-Joachim
1998.
Inorganic trace analysis by mass spectrometry.
Spectrochimica Acta Part B: Atomic Spectroscopy,
Vol. 53,
Issue. 11,
p.
1475.