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Morphological studies of nanoclusters on grid-supported polymer thin films

Published online by Cambridge University Press:  31 January 2011

Richard J. Spontak ,
Janet L. Burns  and
Charles J. Echer
Richard J. Spontak*
Affiliation:
Miami Valley Laboratories, The Procter & Gamble Company, Cincinnati, Ohio 45239-8707
Janet L. Burns
Affiliation:
Miami Valley Laboratories, The Procter & Gamble Company, Cincinnati, Ohio 45239-8707
Charles J. Echer
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, California 94720
*
a)Author to whom correspondence should be addressed at the Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695-7907.
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Abstract

Modification of substrates by controlled deposition of nanometer-size particulates (nanoclusters) is an efficient means of fabricating materials designed for applications in which specific surface interactions play a vital role (e.g., molecular catalysis and microelectronics). We have found that highly dispersed nanoclusters form on thin films of poly(siloxaneimide) (PSI) copolymers supported on copper transmission electron microscopy (TEM) grids when subjected to long anneals at elevated temperatures. In this note, we report on the composition and source of these anomalous nanoclusters, as determined by a variety of electron microscopical techniques. Spectra obtained with parallel electron energy-loss spectroscopy (PEELS) indicate that these particulates, which typically measure 4–18 nm in diameter, are composed of copper with a mean valence of +1. Electron microdiffraction patterns reveal that the nanoclusters are polycrystalline, possessing lattice spacings similar to those of Cu2O. Mechanistic routes of formation are suggested based on experimental design, and factors influencing formation are also described.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 9 , September 1992 , pp. 2593 - 2598
Copyright
Copyright © Materials Research Society 1992

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