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Microwave dielectric properties of (Zr0.8Sn0.2)TiO4 ceramics with pentavalent additives

Published online by Cambridge University Press:  03 March 2011

Ki Hyun Yoon
Affiliation:
Department of Ceramic Engineering, Yonsei University, Seoul 120-749, Korea
Young Sol Kim
Affiliation:
Department of Ceramic Engineering, Yonsei University, Seoul 120-749, Korea
Eung Soo Kim
Affiliation:
Department of Materials Engineering, Kyonggi University, Suwon 442-760, Korea
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Abstract

The microwave dielectric properties of (Zr0.8Sn0.2)TiO4 were investigated as a function of the amount of additives such as Nb2O5 Ta2O5 and Sb2O5 in the temperature range of 20 °C to 80 °C at 7 GHz. As the amount of additives increased up to 1.0 mol %, the unloaded Q increased due to the decrease of oxygen vacancies in the (Zr0.8Sn0.2)TiO4 lattice and then decreased with further addition of additives because the electron concentration was increased. The temperature coefficient of the resonant frequency turned more negative with increasing additives. Although the Nb+5, Ta+5, and Sb+5 ions have a similar ionic size and the same valence electronics, each resulted in different microwave dielectric properties.

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Articles
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Wu, J. M., Chang, M. C., and Yao, P. C., J. Am. Ceram. Soc. 73, 1599 (1990).CrossRefGoogle Scholar
2Wakino, K., Minai, K., and Tamura, H., J. Am. Ceram. Soc. 67, 278 (1984).CrossRefGoogle Scholar
3Kim, E. S., Kim, J. B., Jo, K. H., and Yoon, K.H., in Dielectric Ceramics: Processing, Properties, and Applications, edited by Nair, K. M., Guha, J. P., and Okamoto, A. (Ceramic Transactions 32, San Francisco, CA, 1992), p. 231.Google Scholar
4Wolfram, G. and Gobel, H. E., Mater. Res. Bull. XVI, 1455 (1981).CrossRefGoogle Scholar
5Osbond, P. C., Whatmore, R. W., and Ainger, F. W., Br. Ceram. Proc. 36, 167 (1985).Google Scholar
6Heiao, Y. C., Wu, L., Wei, C. C., Mater. Res. Bull. XXIII, 1687 (1988).CrossRefGoogle Scholar
7Iddles, D. N., Bell, A. J., and Moulson, A. J., J. Mater Sci. 27, 6303 (1992).CrossRefGoogle Scholar
8Fang, Y., Xu, Z., Hu, A., and Payne, D. A., Ferroelectrics 135, 139 (1992).CrossRefGoogle Scholar
9Hakki, B. W. and Coleman, P. D., IEEE Trans. MTT 8, 402 (1960).CrossRefGoogle Scholar
10CRC Handbook of Chemistry and Physics (CRC Press, Inc., Boca Raton, FL, 1987), pp. B73B140.Google Scholar
11Silverman, B. D., Phys. Rev. 125, 1921 (1962).CrossRefGoogle Scholar
12Blasse, G., J. Inorg. Nucl. Chem. 26, 1191 (1964).CrossRefGoogle Scholar
13Bosman, A. J. and Havinga, E. E., Phys. Rev. 129, 1593 (1960).CrossRefGoogle Scholar
14Nishigaki, S., Yano, S., Kato, H., Hirai, T., and Nonomura, T., J. Am. Ceram. Soc. 71, c11 (1988).CrossRefGoogle Scholar