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Microstructure and superconducting properties of hot-pressed Bi–Pb–Sr–Ca–Cu–O thick film

Published online by Cambridge University Press:  31 January 2011

Norimitsu Murayama ,
Yasuharu Kodama ,
Shuji Sakaguchi  and
Fumihiro Wakai
Norimitsu Murayama
Affiliation:
Government Industrial Research Institute–Nagoya, 1–1 Hirate-cho, Kita-ku, Nagoya 462, Japan
Yasuharu Kodama
Affiliation:
Government Industrial Research Institute–Nagoya, 1–1 Hirate-cho, Kita-ku, Nagoya 462, Japan
Shuji Sakaguchi
Affiliation:
Government Industrial Research Institute–Nagoya, 1–1 Hirate-cho, Kita-ku, Nagoya 462, Japan
Fumihiro Wakai
Affiliation:
Government Industrial Research Institute–Nagoya, 1–1 Hirate-cho, Kita-ku, Nagoya 462, Japan
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Abstract

Superconducting Bi1.84Pb0.34Sr2.03Ca1.9Cu3.06Oy thick films were prepared on MgO substrates by screen printing with the powder consisting almost entirely of the 110 K phase. The thick film sandwiched between the two MgO substrates was then hot-pressed in air under various conditions. The thickness of the film was 20–40 μm. The degree of grain orientation was quantitatively evaluated through the image analysis on the SEM micrographs for the chemically etched cross sections of the samples. The degree of grain orientation and the critical current density (Jc) increased with increasing hot-pressing temperature. When hot-pressed at 855 °C under a constant pressure of 500 kg/cm2 for 270 min, the Jc had a maximum value of 9500 A/cm2 (77 K, 0 Oe), and the critical temperature was 110 K. When the hot-pressing pressure was higher than 200 kg/cm2, the degree of grain orientation was almost independent of hot-pressing pressure. Nevertheless, the Jc increased with increasing hot-pressing pressure. The relationship between the magnetic field dependence of Jc and hot-pressing conditions was examined.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 7 , July 1991 , pp. 1425 - 1432
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1.Dersch, H. and Blatter, G., Phys. Rev. B 38, 11391 (1988).CrossRefGoogle Scholar
2.Maeda, H., Tanaka, Y., Fukutomi, M., and Asano, T., Jpn. J. Appl. Phys. 27, L290 (1988).CrossRefGoogle Scholar
3.Takano, M., Takada, J., Oda, K., Kitaguchi, H., Miura, Y., Ikeda, Y., Tornii, Y., and Mazaki, H., Jpn. J. Appl. Phys. 27, L1041 (1988).CrossRefGoogle Scholar
4.Dietderich, D.R., Ullmann, B., Freyhardt, H.C., Kase, J., Kumakura, H., Togano, K., and Maeda, H., Jpn. J. Appl. Phys. 29, L1100 (1990)CrossRefGoogle Scholar
5.Murayama, N., Sudo, E., Awano, M., Kani, K., and Torii, Y., Jpn. J. Appl. Phys. 27, L1856 (1988).CrossRefGoogle Scholar
6.Yoshizaki, R., Ikeda, H., Yoshikawa, K., and Tornita, N., Jpn. J. Appl. Phys. 29, L753 (1990).CrossRefGoogle Scholar
7.Dou, S. X., Liu, H. K., Wang, J., and Song, K. H., Physica C 171, 293 (1990).CrossRefGoogle Scholar
8.Murayama, N., Hiramatsu, Y., and Torii, Y., Jpn. J. Appl. Phys. 29, L875 (1990).CrossRefGoogle Scholar
9.Aota, K., Hattori, H., Hatano, T., Nakamura, K., and Ogawa, K., Jpn. J. Appl. Phys. 28, L2196 (1989).CrossRefGoogle Scholar
10.Martin, S., Fiory, A. T., Fleming, R. M., Espinosa, G. P., and Cooper, A. S., Appl. Phys. Lett. 54, 72 (1989).CrossRefGoogle Scholar
11.Peterson, R. L. and Ekin, J.W., Physica C 157, 325 (1989).CrossRefGoogle Scholar
12.Yasukochi, K., Ogasawara, T., and Ushino, N., J. Phys. Soc. Jpn. 19, 1649 (1964).CrossRefGoogle Scholar
13.Ekin, J. W., Larson, T. M., Hermann, A. M., Sheng, Z. Z., Togano, K., and Kumakura, H., Physica C 160, 489 (1989).CrossRefGoogle Scholar
14.Peterson, R. L. and Ekin, J. W., Phys. Rev. B 42, 8014 (1990).CrossRefGoogle Scholar
15.Hikata, T., Nishikawa, T., Mukai, H., Sato, K., and Hitotsuyanagi, H., Jpn. J. Appl. Phys. 28, L1204 (1989).CrossRefGoogle Scholar
16.Murayama, N., Kodama, Y., Sakaguchi, S., Wakai, F., and Torii, Y., Physica C 174, 335 (1991).CrossRefGoogle Scholar