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Magnetization, micro-x-ray fluorescence, and transmission electron microscopy studies of low concentrations of nanoscale Fe3O4 particles in epoxy resin

Published online by Cambridge University Press:  31 January 2011

A. N. Thorpe ,
F. E. Senftle ,
M. Holt ,
J. Grant ,
W. Lowe ,
H. Anderson ,
E. Williams ,
C. Monkres  and
A. Barkatt
A. N. Thorpe
Affiliation:
Physics Department, Howard University, Washington, District of Columbia 20059
F. E. Senftle
Affiliation:
Physics Department, Howard University, Washington, District of Columbia 20059
M. Holt
Affiliation:
Physics Department, Howard University, Washington, District of Columbia 20059
J. Grant
Affiliation:
Physics Department, Howard University, Washington, District of Columbia 20059
W. Lowe
Affiliation:
MHATT-CAT, Howard University, Washington, District of Columbia 20059
H. Anderson
Affiliation:
MHATT-CAT, Howard University, Washington, District of Columbia 20059
E. Williams
Affiliation:
MHATT-CAT, Howard University, Washington, District of Columbia 20059
C. Monkres
Affiliation:
Department of Chemistry, The Catholic University of America, Washington, District of Columbia 20064
A. Barkatt
Affiliation:
Department of Chemistry, The Catholic University of America, Washington, District of Columbia 20064
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Abstract

Magnetization measurements, transmission electron microscopy (TEM), and high-resolution micro-x-ray fluorescence (μ-XRF) using a synchrotron radiation source (Advanced Photon Source) were used to examine Fe3O4 particle agglomerates of nominally 10-nm particles at low concentrations (down to 0.03%) in thick epoxy resin samples. The magnetization measurements showed that at low concentrations (<0.5%) the magnetite particles, although closely packed in the agglomerates, did not interact magnetically. Predicated on a 2-μm sample step scan, the μ-XRF results were compatible with the presence of spherical agglomerates due to magnetostatic attraction, and these ranged in size from 100 to several thousand nanometers, as observed in TEM measurements. At smaller step scans the resolution could be significantly improved. Thus, the synchroton μ-XRF method was very useful in detecting very small concentrations of particles in thick samples and could probably be used to detect particles in amounts as low as 10−16 g.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 11 , November 2000 , pp. 2488 - 2493
Copyright
Copyright © Materials Research Society 2000

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References

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