Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-25T15:53:20.409Z Has data issue: false hasContentIssue false

Magnetic domains along shear bands in amorphous metals observed by spin-polarized scanning electron microscopy

Published online by Cambridge University Press:  31 January 2011

W.J. Tseng
Affiliation:
Materials Science Program, Department of Mechanical Engineering, University of Rochester, Rochester, New York 14627
K. Koike
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan
J.C.M. Li
Affiliation:
Materials Science Program, Department of Mechanical Engineering, University of Rochester, Rochester, New York 14627
Get access

Abstract

A novel spin-polarized scanning electron microscope with capabilities of observing microscopic domain structures and determining in-plane magnetization directions has been used to investigate the stress-induced magnetic domains in the Fe78B13Si9 (Allied 2605-S2) metallic glass. The magnetic structure in the vicinity of shear bands that are produced near a Mode III crack has been examined. On the tensile side of bending, arrays of individual, discontinuous magnetic “islands” of similar shape and size (about 2–10 μm in length, 3 μm in width, and spaced about 2–4 μm apart) are uniformly distributed on one side of the shear bands. Their easy axis is about parallel to the shear bands. On the other hand, well-defined elliptical domains are found between shear bands on the compression side of bending. Their easy axes are approximately perpendicular to the shear bands. These results suggest the existence of isolated defects of similar stress fields located along the shear bands. The possibility that these defects are dislocations will be investigated next.

Type
Articles
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Schroeder, G., Schafer, R., and Kronmiiller, H., Phys. Status Solidi A 50, 475 (1978).CrossRefGoogle Scholar
2Livingston, J. D., Phys. Status Solidi A 56, 637 (1979).CrossRefGoogle Scholar
3Kronmiiller, H. and Fernengel, W., Phys. Status Solidi A 64, 593 (1981).CrossRefGoogle Scholar
4Livingston, J.D. and Morris, W. G., J. Appl. Phys. 57 (1), 3555 (1985).CrossRefGoogle Scholar
5Siemko, A., Lachowicz, H. K., Moser, N., Forkl, A., and Kronmiiller, H., J. Magn. Magn. Mater. 83, 171 (1990).CrossRefGoogle Scholar
6Veider, A., Badurek, G., Grossinger, R., and Kronmiiller, H., J. Magn. Magn. Mater. 60, 182 (1986).CrossRefGoogle Scholar
7Livingston, J. D. and Morris, W. G., IEEE Trans. Magn. MAG-20 5, 1379 (1984).CrossRefGoogle Scholar
8Li, J. C. M., Rapidly Solidified Amorphous and Crystalline Alloys, edited by Kear, B.H., Giessen, B.C., and Cohen, M. (Elsevier Science Publishing Co., Inc., New York, 1982), pp. 267276.Google Scholar
9Masumoto, T. and Maddin, R., Acta Metall. 19, 725 (1971).CrossRefGoogle Scholar
10Pampillo, C.A., Scripta Metall. 6, 915 (1972).CrossRefGoogle Scholar
11Lakshmanan, V., Li, J.C.M., and Tsai, C.L., Acta Metall. Mater. 38 (4), 625 (1990).CrossRefGoogle Scholar
12Lakshmanan, V. and Li, J. C. M., Mater. Sci. Eng. 98, 483 (1988).CrossRefGoogle Scholar
13Li, J.C.M., Metall. Trans. A 16A, 2227 (1985).CrossRefGoogle Scholar
14Kronmiiller, H., in 5th Risø Int. Symp. Metall. and Mater. Sci., 1984, p. 79.Google Scholar
15Koike, K., Matsuyama, H., and Hayakawa, K., Scanning Microsc. Suppl. 1, 241 (1987).Google Scholar
16Scheinfein, M. R., Unguris, J., Kelley, M. H., Pierce, D.T., and Celotta, R.J., Rev. Sci. Instrum. 61 (10), 2501 (1990).CrossRefGoogle Scholar
17Chrobok, G. and Hofmann, G., Phys. Lett. 57A, 257 (1976).CrossRefGoogle Scholar
18Matsuyama, H. and Koike, K., Rev. Sci. Instrum. 62 (4), 970 (1991).CrossRefGoogle Scholar
19Alpas, A.T., Edwards, L., and Reid, C. N., Acta Metall. 35 (3), 787 (1987).CrossRefGoogle Scholar
20Koike, K., Matsuyama, H., Tseng, W.J., and Li, J.C.M., unpublished work.Google Scholar