Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-22T22:40:27.171Z Has data issue: false hasContentIssue false
  • English
  • Français

Local Electronic Structure in Ordered Aggregates of Carbon Nanotubes: Scanning Tunneling Microscopy/scanning Tunneling Spectroscopy Study

Published online by Cambridge University Press:  31 January 2011

D. L. Carroll ,
P. M. Ajayan  and
S. Curran
D. L. Carroll
Affiliation:
Department of Physics and Astronomy, Clemson University, Clemson, South Carolina 29634
P. M. Ajayan
Affiliation:
Department of Materials Science & Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180–3590
S. Curran
Affiliation:
Department of Physics, Trinity College Dublin, Dublin, Ireland
Get access

Abstract

The recent application of tunneling probes in electronic structure studies of carbon nanotubes has proven both powerful and challenging. Using scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS), local electronic properties in ordered aggregates of carbon nanotubes (multiwalled nanotubes and ropes of single walled nanotubes) have been probed. In this report, we present evidence for interlayer (concentric tube) interactions in multiwalled tubes and tube-tube interactions in singlewalled nanotube ropes. The spatially resolved, local electronic structure, as determined by the local density of electronic states, is shown to clearly reflect tube-tube interactions in both of these aggregate forms.

Type
Articles
Information
Journal of Materials Research , Volume 13 , Issue 9 , September 1998 , pp. 2389 - 2395
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Iijima, S., Nature (London) 354, 56 (1991).CrossRefGoogle Scholar
2.Ebbesen, T. W. and Ajayan, P. M., Nature (London) 358, 220 (1992).CrossRefGoogle Scholar
3.Bethune, D. S., Kiang, C. H., de Vires, M. S., Gorman, G., Savoy, R., Vazquez, J., and Beyers, R., Nature (London) 363, 605 (1993).CrossRefGoogle Scholar
4.Iijima, S. and Ichihashi, T., Nature (London) 363, 603 (1993).CrossRefGoogle Scholar
5.Dresselhaus, M. S., Dresselhaus, G., Eklund, P., and Saito, R., Physics World, 33–38 (January, 1998).CrossRefGoogle Scholar
6.Dresselhaus, M. S., Dresselhaus, G., and Eklund, P., Science of Fullerenes and Carbon Nanotubes (Academic Press, New York, 1997).Google Scholar
7.Thess, A., Lee, R., Nikolaev, P., Dai, H., Petit, P., Robert, J., Xu, C., Lee, Y. H., Kim, S. G., Rinzler, A. G., Colbert, D. T., Scuseria, G. E., Tomanek, D., Fischer, J. E., and Smalley, R. E., Science 273, 483 (1996).CrossRefGoogle Scholar
8.Delaney, P., Choi, H. J., Ihm, J., Louie, S. G., and Cohen, M. L., Nature (London) 391, 466 (1998).CrossRefGoogle Scholar
9.Carroll, D. L., Redlich, Ph., Ajayan, P. M., Charlier, J-C., Blase, X., De Vita, A., and Car, R., Phys. Rev. Lett. 78, 2881 (1997).CrossRefGoogle Scholar
10.Carroll, D. L., Redlich, Ph., Blase, X., Charlier, J-C., Curran, S., Ajayan, P. M., Roth, S., and Rühle, M., unpublished.Google Scholar
11.Journet, C., Maser, W. K., Bernier, P., Loiseau, A., Chappelle, M. Lamy della, Lefrant, S., Deniard, P., Lee, R., and Fischer, J. E., Nature (London) 388, 756 (1997).CrossRefGoogle Scholar
12.Redlich, Ph., Loeffler, J., Ajayan, P. M., Bill, J., Aldinger, F., and Ruhle, M., Chem. Phys. Lett. 260, 465 (1996).CrossRefGoogle Scholar
13.Albrecht, T. R., Mizes, H. A., Nogami, J., Park, S-I., and Quate, C., Appl. Phys. Lett. 52, 362 (1988).CrossRefGoogle Scholar
14.Curran, S., Carroll, D. L., Redlich, P., Ajayan, P. M., Roth, S., and Rühle, M., Adv. Mater. 3 (4), 311 (1998).3.0.CO;2-U>CrossRefGoogle Scholar
15.Carroll, D. L., Kinlen, P., Raman, S., Redlich, P., Rühle, M., Blase, X., Charlier, J. C., Curran, S., Roth, S., and Ajayan, P. M., in Molecular Nanostructures, edited by Kuzmany, H. (World Scientific Publishers, Singapore, 1997), p. 290.Google Scholar
16.Keller, D. J. and Franke, F., Surf. Sci. 294, 409 (1993); D. Keller, Surf. Sci. 253, (1991); G. Reiss, J. Vancea, H. Wittmann, J. Zweck, and H. Hoffmann, J. Appl. Phys. 67(3), 1156 (1990).CrossRefGoogle Scholar
17.Liang, Y., Carroll, D. L., and Bonnell, D. A., in Structure and Properties of Interfaces in Ceramics, edited by Bonnell, D. A., Rühle, M., and Chowdhry, U. (Mater. Res. Soc. Symp. Proc. 357, Pittsburgh, PA, 1995), p. 3.Google Scholar
18. For an excellent reference comparing the various spectroscopic techniques, see Wiesendanger, R., Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, Cambridge, UK, 1994).CrossRefGoogle Scholar
19.Feenstra, R. M., Phys. Rev. B 50, 4561 (1994).CrossRefGoogle Scholar
20.Sarid, D., Exploring Scanning Probe Microscopy with Mathematica (John Wiley & Sons Publishers, New York, 1997).Google Scholar
21.Chen, J., Introduction to Scanning Tunneling Microscopy (Oxford University Press, New York, 1993), p. 301.CrossRefGoogle Scholar
22.Rivera, W., Perez, J., Ruoff, R., Lorents, D., Malhotra, R., Lim, S., Rho, Y., Jacobs, E., and Pinizzotto, R., in Atomic Force Microscopy/Scanning Tunneling Microscopy, edited by Cohen, S. (Plenum Press, New York, 1994), p. 137; M. Gallagher, D. Chen, B. Jacobsen, D. Sarid, L. Lamb, F. Tnkler, J. Jiao, D. Huffman, S. Seraphin, and D. Zhou, Surf. Sci. Lett. 281, L335 (1993); W. Rivera, J. Perez, R. Ruoff, D. Lorents, R. Malhotra, S. Lim, Y. Rho, E. Jacobs, and R. Pinizzotto, J. Vac. Sci. Technol. B 13, 327 (1995).CrossRefGoogle Scholar
23.Wang, C., Li, X., Shang, G., Qiu, X., and Bai, C., J. Vac. Sci. Technol. B 15, 1378 (1997).CrossRefGoogle Scholar
24.Holzwarth, N., Louie, S., and Rabii, S., Phys. Rev. B 26, 5382 (1982).CrossRefGoogle Scholar
25.Fauster, T., Himpsel, F., Fisher, J., and Plummer, W., Phys. Rev. Lett. 51, 430 (1983).CrossRefGoogle Scholar
26.Reihl, B., Gimzewski, J., Nichols, J., and Tosatti, E., Phys. Rev. B 33, 5770 (1986).CrossRefGoogle Scholar
27.Ajiki, H. and Ando, T., Solid State Commun. 102, 135 (1997).CrossRefGoogle Scholar
28.Wildöer, J. W. G., Venema, L., Rinzler, A., Smalley, R., and Dekker, C., Nature (London) 391, 59 (1998); T. Odom, J. Huang, P. Kim, and C. Lieber, Nature (London) 391, 62 (1998).CrossRefGoogle Scholar
29.Stephan, O., Ajayan, P. M., Colliex, C., Cyrot-Lackman, F., and Sandre, E., Phys. Rev. B 53, 13 824 (1996).CrossRefGoogle Scholar
30.Charlier, J-C. and Michenaud, J. P., Phys. Rev. Lett. 70, 1858 (1993).CrossRefGoogle Scholar
31.Charlier, J-C., Gonze, X., and Michenaud, J. P., Europhys. Lett. 29, 43 (1995).CrossRefGoogle Scholar