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Layered titanate thin film as an electrode material

Published online by Cambridge University Press:  03 March 2011

Akio Ishikawa
Affiliation:
Chemical Resources Laboratory, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama 226-8503, Japan
Tsuyoshi Takata
Affiliation:
Chemical Resources Laboratory, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama 226-8503, Japan
Junko N. Kondo
Affiliation:
Chemical Resources Laboratory, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama 226-8503, Japan
Michikazu Hara
Affiliation:
Chemical Resources Laboratory, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama 226-8503, Japan
Yasumichi Matsumoto
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Kumamoto University, 2-39-1 Kurokami, Kumamoto 860-0862, Japan
Kazunari Domen*
Affiliation:
Chemical Resources Laboratory, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama 226-8503, Japan; and Core Research for Evolutional Science and Technology (CREST), Japan Science and Technology Co. (JST), 2-1-13 Higashiueno, Taito-ku, Tokyo 110-0015, Japan
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A thin film composed of an ion-exchangeable layered oxide HxTi(2-x/4)x/4O4 (HTiO) (where the open square, ⃞, is vacancy) is studied as an electrode material. The thin film prepared on an indium tin oxide substrate functions as an electrode for the redox reaction of Ru(bpy)32+/Ru(bpy)33+ without noticeable degradation. Lack of reaction in the presence of Fe(CN)64−/Fe(CN)63− indicates that reaction on this electrode occurs in the interlayers between titanate sheets. A Ru(bpy)32+-intercalated form of the electrode generates photocurrent under visible light irradiation.

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Articles
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1Yoshimura, M., Yoo, S.E., Hayashi, M. and Ishizawa, N.: Jpn. J. Appl. Phys. 28, L2007 (1989).CrossRefGoogle Scholar
2Yoo, S.E., Hayashi, M., Ishizawa, N. and Yoshimura, M.: J. Am. Ceram. Soc. 73, 2561 (1990).CrossRefGoogle Scholar
3Joensen, P., Frindt, R.F. and Morrison, S.R.: Mater. Res. Bull. 21, 457 (1986).CrossRefGoogle Scholar
4Treacy, M.M.J., Rice, S.B., Jacobson, A.J. and Lewandowski, J.T.: Chem. Mater. 2, 279 (1990).CrossRefGoogle Scholar
5Lee, H., Kepley, L.J. and Mallouk, T.E.: J. Am. Chem. Soc. 110, 618 (1988).CrossRefGoogle Scholar
6Keller, S.W., Kim, H-N. and Mallouk, T.E.: J. Am. Chem. Soc. 116, 8817 (1994).CrossRefGoogle Scholar
7Sumida, T., Abe, R., Hara, M., Kondo, J.N. and Domen, K.: Electrochemistry 67, 1224 (1999).CrossRefGoogle Scholar
8Sumida, T., Abe, R., Hara, M., Kondo, J.N. and Domen, K.: J. Mater. Res. 15, 2587 (2000).CrossRefGoogle Scholar
9Abe, R., Shinohara, K., Tanaka, A., Hara, M., Kondo, J.N. and Domen, K.: Chem. Mater. 10, 329 (1998).CrossRefGoogle Scholar
10Abe, R., Ikeda, S., Kondo, J.N., Hara, M. and Domen, K.: Thin Solid Films 343–344, 156 (1999).CrossRefGoogle Scholar
11Abe, R., Kondo, J.N., Hara, M. and Domen, K.: Supramolecular Science 5, 229 (1998).CrossRefGoogle Scholar
12Sasaki, T., Watanabe, M., Michiue, Y., Komatsu, Y., Izumi, F. and Takenouchi, S.: Chem. Mater. 7, 1001 (1995).CrossRefGoogle Scholar
13Matsumoto, Y., Funatsu, A., Matsuo, D., Unal, U. and Ozawa, K.: J. Phys. Chem. B 105, 10893 (2001).CrossRefGoogle Scholar
14Sumida, T., Takahara, Y., Abe, R., Hara, M., Kondo, J.N., Domen, K., Kakihana, M. and Yoshimura, M.: Phys. Chem. Chem. Phys. 3, 640 (2001).CrossRefGoogle Scholar
15Nazeeruddium, M.K., Kay, A., Rodicio, I., Humphry-Baker, R., Muller, E., Liska, P., Vlachopoulos, N. and Grätzel, M.: J. Am. Chem. Soc. 115, 6382 (1993).CrossRefGoogle Scholar
16Ghosh, P.K. and Bard, A.J.: J. Am. Chem Soc. 105, 5691 (1983).CrossRefGoogle Scholar
17Ege, D., Ghosh, P.K., White, J.R., Equey, J.F. and Bard, A.J.: J. Am. Chem. Soc. 107, 5644 (1985).CrossRefGoogle Scholar
18Lytle, F.E. and Hercules, D.M.: J. Am. Chem. Soc. 91, 253 (1969).CrossRefGoogle Scholar
19Yagi, M., Nagai, K., Kira, A. and Kaneko, M.: J. Electroanal. Chem. 394, 169 (1995).CrossRefGoogle Scholar
20Yagi, M., Nagai, K., Oikubo, T. and Kaneko, M.: J. Electroanal. Chem. 383, 61 (1995).CrossRefGoogle Scholar
21Nakato, T., Sakamoto, D., Kuroda, K. and Kato, C.: Bull. Chem. Soc. Jpn. 65, 322 (1992).CrossRefGoogle Scholar
22Kalyanasundaram, K.: Coord. Chem. Rev. 46, 159 (1982).CrossRefGoogle Scholar
23Juris, A., Balzani, V., Barigelletti, F., Campagna, S. and Von Zelewsky, A.: Coord. Chem. Rev. 84, 85 (1998).CrossRefGoogle Scholar