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Layered lead zirconate titanate and lanthanum-doped lead zirconate titanate ceramic thin films

Published online by Cambridge University Press:  31 January 2011

Todd Myers ,
Parag Banerjee ,
Susmita Bose  and
Amit Bandyopadhyay
Todd Myers
Affiliation:
School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164–2920
Parag Banerjee
Affiliation:
School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164–2920
Susmita Bose
Affiliation:
School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164–2920
Amit Bandyopadhyay
Affiliation:
School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164–2920
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Abstract

The physical layering of sol-gel-derived lead zirconate titanate (PZT) 52/48 and lanthanum-doped PZT (PLZT) 2/52/48 on platinized silicon substrates was investigated to determine if the ferroelectric properties and fatigue resistance could be influenced by different layering sequences. Monolithic thin films of PZT and PLZT were characterized to determine their ferroelectric properties. Sandwich structures of Pt/PZT/PLZT/PLZT/PZT/Au and Pt/PLZT/PZT/PZT/PLZT/Au and alternating structures of Pt/PZT/PLZT/PZT/PLZT/Au and Pt/PLZT/PZT/PLZT/PZT/Au were then fabricated and characterized. X-ray photoelectron spectroscopy depth profiles revealed that the layering sequence remained intact up to 700 °C for 45 min. It was found that the end layers in the multilayered films had a significant influence on the resulting hysteresis behavior and fatigue resistance. A direct correlation of ferroelectric properties and fatigue resistance can be made between the data obtained from the sandwiched structures and their end-layer monolithic thin film counterparts. Alternating structures also showed an improvement in the fatigue resistance while the polarization values remained between those for PZT and PLZT thin films.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 9 , September 2002 , pp. 2379 - 2385
Copyright
Copyright © Materials Research Society 2002

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