Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-26T09:20:26.007Z Has data issue: false hasContentIssue false
  • English
  • Français

Latest developments for microstructural and chemical characterization of diffusion bonding in superplastic 8090 Al–Li alloys

Published online by Cambridge University Press:  31 January 2011

A. Ureña ,
J. M. Gómez de Salazar ,
J. J. Martín  and
J. Quiñones
A. Ureña
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
J. M. Gómez de Salazar
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
J. J. Martín
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
J. Quiñones
Affiliation:
Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Spain
Get access

Abstract

This paper describes a new application of two complementary surface characterization techniques to study solid-state bonding in an Al–Li alloy. Through the two mentioned techniques, Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS), important findings about what takes place in the bond interface have been determined. These findings enclose both the formation of discontinuous mixed oxides and the evolution of Li through the bond line and into theadjacent diffusion affected zones. Homogenization of Li and Cu alloyelements has been detected even in those cases where a metallic interlayer was used to favor the union.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 1 , January 1996 , pp. 63 - 71
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Lavernia, E. J. and Grant, N. J., J. Mater. Sci. 22, 1521 (1987).CrossRefGoogle Scholar
2.Martin, J. W., Ann. Rev. Mater. Sci. 18, 101 (1988).Google Scholar
3.Peel, C. J., Evans, B., and Mc Darmaid, D. in Proc. Conf. Aluminium-Lithium Alloys III (Institute of Metals, London, 1986), p. 26.Google Scholar
4.Pickews, J. R., J. Mater. Sci. 25, 3035 (1990).Google Scholar
5.Lippold, J. C., in Proc. Conf. Aluminium-Lithium Alloys V (MCEP, Birmingham, 1989), p. 1365.Google Scholar
6.Martukanitz, R. P., Natalie, C. A., and Knoetel, J. O., Met, J.. 39, 38 (1987).Google Scholar
7.Molian, P. A. and Srivatsan, T. S., J. Mater. Sci. 25, 3347 (1990).Google Scholar
8.Dunford, D. V. and Partridge, P. G., Mater. Sci. Technol. 8, 385 (1992).CrossRefGoogle Scholar
9.Uren¯a, A. and Dunkerton, S. B., in Diffusion Bonding of an Aluminium-Lithium Alloy (AA8090), Welding Institute Research Report No. 403 (The Welding Institute, Abington, Cambridge, 1989).Google Scholar
10.Gilmore, C. J., Dunford, D. V., and Partridge, P. G., J. Mater. Sci. 26, 3119 (1991).Google Scholar
11.Sunwoo, A., Scripta Metall. Mater. 31, 407 (1994).CrossRefGoogle Scholar
12.Wadsworth, J., Henshall, C. A., and Niegh, T. G., in Proc. Conf. Aluminium-Lithium III (The Institute of Metals, London, 1986), p. 199.Google Scholar
13.Ricks, R. A. and Parson, N. C., in Proc. Conf. Aluminium-Lithium Alloys V (MCEP, Birmingham, 1989), p. 169.Google Scholar
14.Ascani, L., in Proc. Conf. Innovations in Materials and Their Applications (ASM, Chicago, 1977), p. 19.Google Scholar
15.BoloGec, C., Alsthom Tech. Rev. 17, 23 (1991).Google Scholar
16.Harvey, J., Partridge, P. G., and Snook, C. L., J. Mater. Sci. 20, 1009 (1985).Google Scholar
17.Pilling, J. and Ridley, N., Mater. Sci. Technol. 3, 353 (1987).CrossRefGoogle Scholar
18.Ricks, R. A., Mahon, G. J., Parson, N. C., Heinrich, T., and Winkler, P. J., in Diffusion Bonding 2, edited by Stephenson, D. J. (Elsevier Applied Science, London, 1991), p. 69.Google Scholar
19.Quin¯ones, J., Doctoral Thesis, Universidad Complutense de Madrid (1994).Google Scholar
20.Heinzelmann, H., Meyer, E., Rudin, H., and Güntherodt, H. J., in Scanning Tunneling Microscopy and Related Methods, edited by Behm, R. J. (Kluwer Academic Publ., Dordrecht, The Netherlands, 1990), p. 433.Google Scholar
21.Benninshoven, A., Rüdenauer, F. G., and Werner, H. W., in SIMS Spectrometry (John Wiley and Sons, New York, 1987).Google Scholar
22.Calvo, F. A., Uren¯a, A., Gómez de Salazar, J. M., and Molleda, F., J. Mater. Sci. 23, 1231 (1988).Google Scholar
23.Uren¯a, A., Gómez de Salazar, J. M., and Quin¯ones, J., in Proc. Conf. Eurojoin 91, Strasbourg (1991), p. 401.Google Scholar
24.Uren¯a, A., Gómez de Salazar, J. M., Martín, J. J., and Quin¯ones, J., Rev. Soldadura. 24, 119 (1994).Google Scholar