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Island growth of Y2BaCuO5 nanoparticles in (211∼1.5 nm/123∼10 nm)×N composite multilayer structures to enhance flux pinning of YBa2Cu3O7−δ films

Published online by Cambridge University Press:  31 January 2011

T. Haugan ,
P.N. Barnes ,
I. Maartense ,
C.B. Cobb ,
E.J. Lee  and
M. Sumption
T. Haugan*
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
P.N. Barnes
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
I. Maartense
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
C.B. Cobb
Affiliation:
Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7919
E.J. Lee
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210
M. Sumption
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A controlled introduction of second-phase Y2BaCuO5 (211) nanoparticles into YBa2Cu3O7−δ (123) thin films was achieved for the first time for the purpose of increasing flux pinning. The island-growth mode of 211 on 123 was utilized to obtain an area particle density >1011 cm-2 of 211 thick-disk-shaped nanoparticles in individual layers. Composite layered structures of (211y nanoparticles/123z)×N were deposited by pulsed laser deposition on LaAlO3 substrates, with N bilayers = 24 to 100, y thickness = 1 to 2 nm, and z thickness = 6 to 15 nm (assuming continuous layer coverage). With 211 addition, the critical current densities at 77 K were higher at magnetic fields as low as 0.1 T and increased as much as approximately 300% at 1.5 T. The superconducting transition temperature was reduced by approximately 2 to 4 K for 211 volume fraction <20%. Reinitiation of 123 growth after every 211 layer resulted in a smooth and flat surface finish on the films and also greatly reduced surface particulate formation especially in thicker films (∼ μm).

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 11 , November 2003 , pp. 2618 - 2623
Copyright
Copyright © Materials Research Society 2003

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