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Introduction of the real tip defect of Berkovich indenter to reproduce with FEM nanoindentation test at shallow penetration depth

Published online by Cambridge University Press:  05 January 2012

Joël Krier ,
Jacques Breuils ,
Leandro Jacomine  and
Herve Pelletier
Joël Krier
Affiliation:
Institut National des Sciences Appliquées de Strasbourg, F-67034 Strasbourg, France
Jacques Breuils
Affiliation:
Institut National des Sciences Appliquées de Strasbourg, F-67034 Strasbourg, France
Leandro Jacomine
Affiliation:
Institut Charles Sadron, CNRS UPR22, F-67034 Strasbourg Cedex2, France
Herve Pelletier*
Affiliation:
Institut Charles Sadron, CNRS UPR22, F-67034 Strasbourg Cedex2, France
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Indentations tests have been performed on two standard materials SiO2 and Si (100) using two Berkovich indenters presenting different tip defects. Estimations of the tip radii deduced from analyses of maximal applied load versus contact depth and stiffness versus contact depth curves have been compared for experimental observation of each indenter tip obtained with atomic force microscopy (AFM). Results indicate that the determination of the tip defect from data extracted form load–displacement curves is partly dependent on the mechanical properties of the tested material. Then, an original study is proposed to evidence the influence of the tip defect on mechanical response during indentation. Experimental AFM observations of the tip indenter geometries have been introduced in finite element software MSC MARC to reproduce indentation tests on bulk material surfaces. We demonstrated at very shallow penetration depth (less than 50 nm) that the real indenter tip defects have to be considered in the simulation runs, especially to identify accurately the rheological parameters of the tested surface.

Keywords

NanoindentationSimulation
Type
Reviews
Information
Journal of Materials Research , Volume 27 , Issue 1: Focus Issue: Instrumented Indentation , 14 January 2012 , pp. 28 - 38
Copyright
Copyright © Materials Research Society 2012

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