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In situ single-liquid-source metal-organic chemical vapor deposition of (La0.8Ca0.2)MnO3 giant magnetoresistive films

Published online by Cambridge University Press:  03 March 2011

Y.Q. Li*
Affiliation:
Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, Connecticut 06810
J. Zhang
Affiliation:
Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, Connecticut 06810
S. Pombrik
Affiliation:
Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, Connecticut 06810
S. DiMascio
Affiliation:
Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, Connecticut 06810
W. Stevens
Affiliation:
Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, Connecticut 06810
Y.F. Yan
Affiliation:
Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, Connecticut 06810
N.P. Ong
Affiliation:
Department of Physics, Princeton University, Princeton, New Jersey 08544
*
a)Present address: NZ Applied Technology, 150C New Boston Street, Woburn, Massachusetts 01801.
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Abstract

A large magnetoresistance change (ΔR/RH) of −550% has been observed at 270 K in (La0.8Ca0.2)MnO3 thin films. The films were prepared in situ on LaAlO3 substrates by single-liquid-source metal-organic chemical vapor deposition. M(thd)n (M = La, Ca, and Mn, and n = 2, 3) were dissolved together in an organic solution and used as precursors for the deposition of (La0.8Ca0.2)MnO3 thin films. Deposition was conducted at an oxygen partial pressure of 1.2 Torr and a substrate temperature ranging from 600 °C to 700 °C. The mechanism for the large magnetoresistance change in this manganese oxide is briefly discussed.

Type
Rapid Communication
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Baibich, M.N., Broto, J.M., Fert, A., Nguyen van Dau, F., Petroff, F., Etienne, P., Creuzet, G., Friederich, A., and Chazeles, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
2Parkin, S.P., Bhadra, R., and Roche, K.P., Phys. Rev. Lett. 66, 2152 (1991).CrossRefGoogle Scholar
3Fullerton, E. E., Kelly, D. M., Guimpel, J., and Schuller, I. K., Phys. Rev. Lett. 68, 859 (1992).Google Scholar
4Velu, E., Dupas, C., Renard, D., Renard, J. P., and Seiden, J., Phys. Rev. B 37, 669 (1988).Google Scholar
5Chien, C.L., Xiao, J.Q., and Jiang, J., J. Appl. Phys. 73, 5309 (1993).Google Scholar
6Xiao, J. Q., Jiang, J. S., and Chien, C. L., Phys. Rev. Lett. 68, 3749 (1992).Google Scholar
7Chein, C. and Westgate, C., The Hall Effect and Its Applications (Plenum Press, New York, 1979).Google Scholar
8Lenz, J., Proc. IEEE 78, 9073 (1990).Google Scholar
9Mee, C. and Daniel, E., Magnetic Recording Handbook (McGraw-Hill Publishing Company, New York, 1989).Google Scholar
10White, R., IEEE Trans. Magn. 28, September (1992).Google Scholar
11Pohm, A. V., Huang, J.S.T., Daughton, J. M., Krahn, D. R., and Mehra, A., IEEE Trans. Magn. 22, 3117 (1988).Google Scholar
12Pohm, A.V., Comstock, C.S., and Daughton, J.M., IEEE Trans. Magn. 23, 4266 (1989).CrossRefGoogle Scholar
13von Helmolt, R., Wecker, J., Holzapfel, B., Schultz, L., and Samwer, K., Phys. Rev. Lett. 71, 2331 (1993).CrossRefGoogle Scholar
14Chahara, Ken-ichi, Ohno, T., Kasai, M., and Kozono, Y., Appl. Phys. Lett. 63, 1991 (1993).CrossRefGoogle Scholar
15Jin, S., Tiefel, T.H., McCormack, M., Fastnacht, R.A., Ramesh, R., and Chen, L.H., Science 264, 413 (1994).Google Scholar
16Zhang, J., Gardiner, R.A., Kirlin, P. S., Boerstler, R.W., and Stainbeck, J., Appl. Phys. Lett. 61, 2884 (1992).Google Scholar
17Zhang, J., Li, Y.Q., Roader, J., Gordon, D., Buskir, P.V., Lee, J., and Ramesh, R., in 6th Int. Symp. on Integrated Ferroelectrics, Monterey, CA (1994).Google Scholar
18Anderson, P.W. and Hasegawa, H., Phys. Rev. 100, 675 (1955); de Gennes, P-G., Phys. Rev. 118, 141 (1960).Google Scholar
19Inoue, M. and Maekawa, S., unpublished.Google Scholar
20Yan, Y.F., Ong, N.P., Li, Y.Q.et al., unpublished.Google Scholar