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In situ observation of stress evolution in pure tin strip under electromigration using synchrotron radiation x-ray

Published online by Cambridge University Press:  31 January 2011

Albert T. Wu ,
Ciou-Nan Siao ,
Ching-Shun Ku  and
Hsin-Yi Lee
Ciou-Nan Siao
Affiliation:
Department of Chemical and Materials Engineering, National Central University, Jhongli City 320, Taiwan
Hsin-Yi Lee
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan
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Abstract

This investigation elucidates stress evolution in situ in tin strips under electromigration using synchrotron radiation x-ray. Minute variations in stress are determined precisely using intense x-rays. Back stresses gradient with the values of 5.5 and 16.5 MPa/cm, which are induced by the current densities of 1 × 103 and 5 × 103 A/cm2, respectively, are measured directly. The effective diffusivities that include both grain and lattice diffusion at various current densities are determined. The Joule heating is observed, ranging from 5 to 15 °C, according to various current densities passed through the stripes. Results of this study suggest that the protective oxide layer on the surfaces significantly influences the kinetics of stress evolution.

Keywords

ElectromigrationSnStress/strain relationship
Type
Articles
Information
Journal of Materials Research , Volume 25 , Issue 2 , February 2010 , pp. 292 - 295
Copyright
Copyright © Materials Research Society 2010

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