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In situ measurements of texture and phase development in (Bi, Pb)2Sr2Ca2Cu3O10–Ag tapes

Published online by Cambridge University Press:  31 January 2011

T. R. Thurston ,
P. Haldar ,
Y. L. Wang ,
M. Suenaga ,
N. M. Jisrawi  and
U. Wildgruber
T. R. Thurston
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973
P. Haldar
Affiliation:
Intermagnetics General Corporation, Latham, New York 12110
Y. L. Wang
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973
M. Suenaga
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973
N. M. Jisrawi
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York, 11973; Department of Physics, Birzeit University, West Bank, Palestine
U. Wildgruber
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973
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Abstract

Hard x-rays from a synchrotron source were utilized in diffraction experiments performed at elevated temperatures (up to ˜ 870 °C) on (Bi, Pb)2Sr2Ca2Cu3O10 (Bi-2223) tapes completely encased in silver. The general behavior of the phase and texture development under typical processing conditions was determined, and the effects that several variations in processing conditions had on the phase and texture development were examined. These results and their implications for improving processing conditions are discussed.

Type
Articles
Information
Journal of Materials Research , Volume 12 , Issue 4 , April 1997 , pp. 891 - 905
Copyright
Copyright © Materials Research Society 1997

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