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Improving tensile and fatigue properties of Sn–58Bi/Cu solder joints through alloying substrate

Published online by Cambridge University Press:  31 January 2011

Zhe-Feng Zhang*
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People's Republic of China
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

To eliminate the Bi segregation and interfacial embrittlement of the SnBi/Cu joints, we deliberately added some Ag or Zn elements into the Cu substrate. Then, the reliability of the SnBi/Cu–X (X = Ag or Zn) solder joints was evaluated by investigating their interfacial reactions, tensile property, and fatigue life compared with those of the SnBi/Cu and SnAg/Cu joints. The experimental results demonstrate that even after aging for a long time, the addition of the Ag or Zn elements into the Cu substrate can effectively eliminate the interfacial Bi embrittlement of the SnBi/Cu–X joints under tensile or fatigue loadings. Compared with the conventional SnAg/Cu joints, the SnBi/Cu–X joints exhibit higher adhesive strength and comparable fatigue resistance. Finally, the fatigue and fracture mechanisms of the SnBi/Cu–X solder joints were discussed qualitatively. The current findings may pave the new way for the Sn–Bi solder widely used in the electronic interconnection in the future.

Type
Articles
Copyright
Copyright © Materials Research Society 2010

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References

REFERENCES

1.Kang, S.K., Sarkhel, A.K.Lead (Pb)-free solders for electronic packaging. J. Electron. Mater. 23, 701 (1994)CrossRefGoogle Scholar
2.Abtew, M., Selvaduray, G.Lead-free solders in microelectronics. Mater. Sci. Eng., R 27, 95 (2000)CrossRefGoogle Scholar
3.Mei, Z., Morris, J.W. Jr.Characterization of eutectic Sn–Bi solder joints. J. Electron. Mater. 21, 599 (1992)CrossRefGoogle Scholar
4.Glazer, J.Microstructure and mechanical properties of Pb-free solder alloys for low-cost electronic assembly. A review. J. Electron. Mater. 23, 693 (1994)CrossRefGoogle Scholar
5.Smernos, S., Strauss, R.Low-temperature soldering. Electrochem. Commun. 57, 148 (1982)Google Scholar
6.Mei, Z., Hua, F., Glazer, J., Key, C.C.Low temperature soldering21st IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings (IEMT Symposium, Austin, TX 1997)463Google Scholar
7.Liu, P.L., Shang, J.K.Interfacial segregation of bismuth in copper/tin–bismuth solder interconnect. Scr. Mater. 44, 1019 (2001)CrossRefGoogle Scholar
8.Liu, P.L., Shang, J.K.Interfacial embrittlement by bismuth segregation in copper/tin–bismuth Pb-free solder interconnect. J. Mater. Res. 16, 1651 (2001)CrossRefGoogle Scholar
9.Zhu, Q.S., Zhang, Z.F., Wang, Z.G., Shang, J.K.Inhibition of interfacial embrittlement at SnBi/Cu single crystal by electrodeposited Ag film. J. Mater. Res. 23, 78 (2008)CrossRefGoogle Scholar
10.Liu, P.L., Shang, J.K.Fracture of SnBi/Ni(P) interfaces. J. Mater. Res. 20, 818 (2005)CrossRefGoogle Scholar
11.Zou, H.F., Zhang, Q.K., Zhang, Z.F.Eliminating interfacial segregation and embrittlement of bismuth in SnBi/Cu joint by alloying Cu substrate. Scr. Mater. 61, 308 (2009)CrossRefGoogle Scholar
12.Keast, V.J., Fontaine, A.L., Plessis, J.D.Variability in the segregation of bismuth between grain boundaries in copper. Acta Mater. 55, 5149 (2007)CrossRefGoogle Scholar
13.Duscher, G., Chisholm, M.F., Alber, U., Rühle, M.Bismuth-induced embrittlement of copper grain boundaries. Nat. Mater. 3, 621 (2004)CrossRefGoogle ScholarPubMed
14.Schweinfest, R., Paxton, A.T., Finnis, M.W.Bismuth embrittlement of copper is an atomic size effect. Nature 432, 1008 (2004)CrossRefGoogle Scholar
15.Liu, S.Q., Sun, W.Q.Liquids of Ag–Cu–Bi system. Acta Metall. Sinica 24, 376 (1988)Google Scholar
16.Deng, X., Piotrowski, G., Williams, J.J., Chawla, N.Influence of initial morphology and thickness of Cu6Sn5 and Cu3Sn intermetallics on growth and evolution during thermal aging of Sn–Ag solder/Cu joints. J. Electron. Mater. 32, 1403 (2003)CrossRefGoogle Scholar
17.He, M., Chen, Z., Qi, G.J.Solid state interfacial reaction of Sn–37Pb and Sn–3.5Ag solders with Ni–P under bump metallization. Acta Mater. 52, 2047 (2004)CrossRefGoogle Scholar
18.Yoon, J.W., Lim, J.H., Lee, H.J., Joo, J., Jung, S.B., Moon, W.C.Interfacial reactions and joint strength of Sn–37Pb and Sn–3.5Ag solders with immersion Ag-plated Cu substrate during aging at 150 °C. J. Mater. Res. 21, 3196 (2006)CrossRefGoogle Scholar
19.Zou, H.F., Zhang, Q.K., Yang, H.J., Zhang, Z.F.Mater. Sci. Eng., A (2010 in press )Google Scholar
20.Lee, H.T., Chen, M.H., Jao, H.M., Liao, T.L.Influence of interfacial intermetallic compound on fracture behavior of solder joints. Mater. Sci. Eng., A 358, 134 (2003)CrossRefGoogle Scholar
21.Zou, H.F., Zhang, Z.F.Ductile-to-brittle transition induced by increasing strain rate in Sn–3Cu/Cu joints. J. Mater. Res. 23, 1614 (2008)CrossRefGoogle Scholar
22.Yoon, J.W., Jung, S.B.Interfacial reactions and shear strength on Cu and electrolytic Au/Ni metallization with Sn–Zn solder. J. Mater. Res. 21, 1590 (2006)CrossRefGoogle Scholar
23.Shang, P.J., Liu, Z.Q., Li, D.X., Shang, J.K.TEM observations of the growth of intermetallic compounds at the SnBi/Cu interface. J. Electron. Mater. 38, 2579 (2009)CrossRefGoogle Scholar
24.Tojima, K.Wetting Characteristics of Lead-Free Solders, Senior Project Report (Materials Engineering Department, San Jose State University 1999)Google Scholar
25.Yamagishi, Y., Ochiai, M., Ueda, H., Nakanishi, T., Kitazima, M.Pb-free solder of Sn-58Bi improved with AgProceedings of the Ninth International Microelectronics Conference (OmiyaJapan 1996)252Google Scholar
26.Zhang, Q.K., Zhang, Z.F. unpublished workGoogle Scholar
27.Zhang, Q.K., Zhang, Z.F.Fracture mechanism and strength-influencing factors of Cu/Sn–4Ag solder joints aged for different times. J. Alloys Compd. 485, 853 (2009)CrossRefGoogle Scholar
28.Shang, P.J., Liu, Z.Q., Li, D.X., Shang, J.K.Bi-induced voids at the Cu3Sn/Cu interface in eutectic SnBi/Cu solder joints. Scr. Mater. 58, 409 (2008)CrossRefGoogle Scholar
29.Tomlinson, W.J., Collier, I.The mechanical properties and microstructures of copper and brass joints soldered with eutectic tin bismuth solder. J. Mater. Sci. 22, 1835 (1987)CrossRefGoogle Scholar
30.Zhang, Q.K., Zhu, Q.S., Zou, H.F., Zhang, Z.F.Fatigue fracture mechanisms of Cu/lead-free solders interfaces. Mater. Sci. Eng. A (2009 DOI: 10.1016/j.msea.2009.10.040 )Google Scholar