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Imaging of stacking faults in highly oriented pyrolytic graphite using scanning tunneling microscopy

Published online by Cambridge University Press:  31 January 2011

S.R. Snyder ,
T. Foecke ,
H.S. White  and
W.W. Gerberich
S.R. Snyder
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
T. Foecke
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
H.S. White
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
W.W. Gerberich
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
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Abstract

Scanning tunneling microscopy images of the (0001) plane of highly oriented pyrolytic graphite show defect regions consisting of an extensive network of partial dislocations that form extended and contracted nodes. The partial dislocations in hexagonal graphite enclose triangular regions (∼1000 nm on a side) of faulted material comprised of rhombohedral graphite. Electronic and elastic interactions of the tip with the HOPG surface are proposed to explain the observed image contrast between hexagonal and rhombohedral graphite.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 2 , February 1992 , pp. 341 - 344
Copyright
Copyright © Materials Research Society 1992

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