Hostname: page-component-745bb68f8f-mzp66 Total loading time: 0 Render date: 2025-01-11T01:18:02.606Z Has data issue: false hasContentIssue false
  • English
  • Français

Identification of a growth defect in solid C60 by electron diffraction

Published online by Cambridge University Press:  31 January 2011

D.E. Luzzi ,
J.E. Fischer ,
X.Q. Wang ,
D.A. Ricketts-Foot ,
A.R. McGhie  and
W.J. Romanow
D.E. Luzzi
Affiliation:
Department of Materials Science and Engineering and Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
J.E. Fischer
Affiliation:
Department of Materials Science and Engineering and Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
X.Q. Wang
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
D.A. Ricketts-Foot
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
A.R. McGhie
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
W.J. Romanow
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
Get access

Abstract

The origin of an anomalous sawtooth-shaped feature in x-ray powder diffraction of solid C60 is explained via electron diffraction analysis. Films sublimed on holey carbon crystallize with close-packed (111) planes parallel to the surface. Rods of diffuse scattering are found along the 〈111〉 axis normal to the surface but not along other 〈111〉 axes. Powder averaging of these rods, coupled with the x-ray form factor of spherical shells with 3.5 Å radius, accounts for the sawtooth feature. We attribute this phenomenon to planar defects parallel to close-packed layers, which form during the growth of solid C60 by sublimation. A possibly related consequence of the growth mode is the observation of strong macroscopic (111) preferred orientation in films sublimed on a variety of substrates.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 2 , February 1992 , pp. 335 - 340
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Kratschmer, W., Lamb, L. D., Fostiropoulos, K., and Huffman, D. R., Nature 347, 354 (1990).Google Scholar
2.Kroto, H. W., Heath, J. R., O'Brien, S. C., Curl, R. F., and Smalley, R. E., Nature 318, 162 (1985); W. Kratschmer, K. Fostiropoulos, and D. R. Huffman, Chem. Phys. Lett. 170, 167 (1990).Google Scholar
3.Fleming, R. M., Siegrist, T., March, P. M., Hessen, B., Kortan, A. R., Murphy, D. W., Haddon, R. C., Tycko, R., Dabbagh, G., Mujsce, A. M., Kaplan, M. L., and Zahurak, S. M., in Clusters and Cluster-Assembled Materials, edited by Averback, R. S., Bernholc, J., and Nelson, D. L. (Mater. Res. Soc. Symp. Proa, 206, Pittsburgh, PA, 1991), p. 691.Google Scholar
4.Fischer, J. E., Heiney, P. A., McGhie, A. R., Romanow, W. J., Denenstein, A. M., McCauley, J. P., Jr., and Smith, A. B.III, Science 252, 1288 (1991).Google Scholar
5.Heiney, P. A., Fischer, J. E., McGhie, A. R., Romanow, W. J., Denenstein, A. M., McCauley, J. P. Jr, Smith, A. B. III, and Cox, D. E., Phys. Rev. Lett. 66, 2911 (1991).CrossRefGoogle Scholar
6.Yannoni, C. S., Johnson, R. D., Meijer, G., Bethune, D. S., and Salem, J. R., J. Phys. Chem. 95, 9 (1991).Google Scholar
7.Tycko, R., Haddon, R. C., Dabbagh, G., Glarum, S. H., Douglass, D. C., and Mujsce, A. M., J. Phys. Chem. 95, 518 (1991).CrossRefGoogle Scholar
8.Warren, B. E., Phys. Rev. 59, 693 (1941).CrossRefGoogle Scholar
9.Edwards, O. S., Jefferson, M. E., and Wilson, A. J. C., Nature 148, 165 (1941).CrossRefGoogle Scholar
10.Fleming, R. M., Kortan, A. R., Hessen, B., Siegrist, T., Thiel, F. A., Marsh, P. M., Maddon, R. C., Tycko, R., Dabbagh, G., Kaplan, M. L., and Mujsce, A. M., Phys. Rev. (submitted).Google Scholar
11.Haddon, R. C., Hebard, A. F., Rosseinsky, M. J., Murphy, D. W., Duclos, S. J., Lyons, K. B., Miller, B., Rosamilia, J. M., Fleming, R. M., Kortan, A. R., Glarum, S. H., Makhija, A. V., Muller, A. J., Eick, R. H., Zahurak, S. M., Tycko, R., Dabbagh, G., and Theil, F. A., Nature 350, 320 (1991).CrossRefGoogle Scholar
12.Hebard, A. F., Rosseinsky, M. J., Haddon, R. C., Murphy, D. W., Glarum, S. H., Palstra, T. T. M., Ramirez, A. P., and Kortan, A. R., Nature 350, 600 (1991).Google Scholar