Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Gaboriaud, R J
Pailloux, F
Guerin, P
and
Paumier, F
2000.
Yttrium oxide thin films, Y2O3, grown by ion beam sputtering on Si.
Journal of Physics D: Applied Physics,
Vol. 33,
Issue. 22,
p.
2884.
Gaboriaud, R.J
Pailloux, F
Guerin, P
and
Paumier, F
2001.
Yttrium sesquioxide, Y2O3, thin films deposited on Si by ion beam sputtering: microstructure and dielectric properties.
Thin Solid Films,
Vol. 400,
Issue. 1-2,
p.
106.
Belonoshko, A. B.
Gutierrez, G.
Ahuja, R.
and
Johansson, B.
2001.
Molecular dynamics simulation of the structure of yttriaY2O3phases using pairwise interactions.
Physical Review B,
Vol. 64,
Issue. 18,
Gaboriaud, R.J.
Pailloux, F.
and
Perriere, J.
2002.
Pulsed laser deposition of Y2O3 thin films on MgO.
Applied Surface Science,
Vol. 186,
Issue. 1-4,
p.
477.
Paumier, F
Gaboriaud, R.J
and
Kaul, A.R
2002.
Yttrium oxide thin films: chemistry- stoichiometry-strain and microstructure.
Crystal Engineering,
Vol. 5,
Issue. 3-4,
p.
169.
Paumier, F.
and
Gaboriaud, R.J.
2003.
Interfacial reactions in Y2O3 thin films deposited on Si(100).
Thin Solid Films,
Vol. 441,
Issue. 1-2,
p.
307.
Laurikaitis, M.
C˘yvienė, J.
and
Dudonis, J.
2005.
Deposition of Zr–ZrOX and Y–YXOY films by reactive magnetron sputtering.
Vacuum,
Vol. 78,
Issue. 2-4,
p.
395.
Navrotsky, Alexandra
and
Ushakov, Sergey V.
2005.
Materials Fundamentals of Gate Dielectrics.
p.
57.
Park, Seh-Jin
and
Norton, David P.
2006.
Ion beam assisted texturing of polycrystalline Y2O3 films deposited via electron-beam evaporation.
Thin Solid Films,
Vol. 510,
Issue. 1-2,
p.
143.
Kuo, D.H.
and
Chen, W.R.
2006.
Growth and properties of amorphous thin films of the Al2O3–Y2O3 system.
Thin Solid Films,
Vol. 497,
Issue. 1-2,
p.
65.
Alarcón-Flores, G.
Aguilar-Frutis, M.
Falcony, C.
García-Hipolito, M.
Araiza-Ibarra, J. J.
and
Herrera-Suárez, H. J.
2006.
Low interface states and high dielectric constant Y2O3 films on Si substrates.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 24,
Issue. 4,
p.
1873.
Chen, Weiqun
and
Navrotsky, Alexandra
2006.
Thermochemical study of trivalent-doped ceria systems: CeO2–MO1.5(M = La, Gd, and Y).
Journal of Materials Research,
Vol. 21,
Issue. 12,
p.
3242.
Djurovic, Dejan
Zinkevich, Matvei
and
Aldinger, Fritz
2007.
Thermodynamic modeling of the yttrium–oxygen system.
Calphad,
Vol. 31,
Issue. 4,
p.
560.
Alarcón-Flores, G.
Aguilar-Frutis, M.
García-Hipolito, M.
Guzmán-Mendoza, J.
Canseco, M. A.
and
Falcony, C.
2008.
Optical and structural characteristics of Y2O3 thin films synthesized from yttrium acetylacetonate.
Journal of Materials Science,
Vol. 43,
Issue. 10,
p.
3582.
Heiba, Z. K.
and
Arda, L.
2008.
X‐ray diffraction analysis of powder and thin film of (Gd1‐xYx)2O3 prepared by sol‐gel process.
Crystal Research and Technology,
Vol. 43,
Issue. 3,
p.
282.
Tsuchiya, Masaru
Bojarczuk, Nestor A.
Guha, Supratik
and
Ramanathan, Shriram
2010.
Transmission electron microscopy studies on structure and defects in crystalline yttria and lanthanum oxide thin films grown on single crystal sapphire by molecular beam synthesis.
Philosophical Magazine,
Vol. 90,
Issue. 9,
p.
1123.
Yusa, Hitoshi
Tsuchiya, Taku
Sata, Nagayoshi
and
Ohishi, Yasuo
2010.
Dense Yttria Phase Eclipsing the A-Type Sesquioxide Structure: High-Pressure Experiments and ab initio Calculations.
Inorganic Chemistry,
Vol. 49,
Issue. 10,
p.
4478.
Chuan-Hsi Liu
Pi-Chun Juan
Chin-Pao Cheng
Guan-Ting Lai
Huan Lee
Yi-Kuan Chen
Yu-Wei Liu
and
Chih-Wei Hsu
2010.
Structural properties of ultra-thin Y<inf>2</inf>O<inf>3</inf> gate dielectrics studied by X-Ray diffraction (XRD) and X-Ray photoelectron spectroscopy (XPS).
p.
1256.
Samoilenkov, S V
Boytsova, O V
Amelichev, V A
and
Kaul, A R
2011.
Anisotropic strain of BaZrO3, BaCeO3and Y2O3nanoinclusions in a YBa2Cu3O7 −xepitaxial film matrix and its relation to the oxygen content of the superconductor.
Superconductor Science and Technology,
Vol. 24,
Issue. 5,
p.
055003.
Lacroix, Bertrand
Paumier, Fabien
and
Gaboriaud, Rolly J.
2011.
Crystal defects and related stress inY2O3thin films: Origin, modeling, and consequence on the stability of theC-type structure.
Physical Review B,
Vol. 84,
Issue. 1,