Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-05T11:32:04.067Z Has data issue: false hasContentIssue false
  • English
  • Français

High-resolution transmission electron microscopy on KHx–GIC's

Published online by Cambridge University Press:  03 March 2011

L. Salamanca-Riba ,
N.-C. Yeh ,
M. S. Dresselhaus ,
M. Endo  and
T. Enoki
L. Salamanca-Riba
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
N.-C. Yeh
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
M. S. Dresselhaus
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
M. Endo
Affiliation:
Shinshu University, Nagano-shi 380, Japan
T. Enoki
Affiliation:
Institute for Molecular Science, Okazaki 444, Japan

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

The in-plane and c-axis structure of KHx—GIC's and KDy—GIC's is studied using transmission electron microscopy (TEM) and x-ray diffraction as a function of intercalation temperature and time. With the TEM, two commensurate in-plane phases are found to coexist in these compounds with relative concentrations depending on intercalation conditions. When the direct intercalation method is used, the first step of intercalation is the formation of a stage n potassium-GIC and the final compound is a stage n KHx—GIC (or KDy—GIC). Highresolution (00l) lattice images show direct evidence for intermediate phases in the intercalation process. These intermediate phases are hydrogen (deuterium) deficient and are found at the boundary between pure potassium regions and regions with high hydrogen (deuterium) content. A comparison of the structure for the two methods of intercalation of KH is also presented.

Type
Articles
Information
Journal of Materials Research , Volume 1 , Issue 1 , February 1986 , pp. 177 - 186
Copyright
Copyright © Materials Research Society 1986

References

REFERENCES

1Dresselhaus, M. S. and Dresselhaus, G., Adv. Phys. 30, 139 (1981).CrossRefGoogle Scholar
2Guérard, D., Takoudjou, C., and Rousseaux, F., Synth. Met. 7, 43 (1983).CrossRefGoogle Scholar
3Colin, M. and Hérold, A., Bull. Soc. Chim. Fr., 1982 (1971).Google Scholar
4Guérard, D., Lagrange, P., and Hérold, A., Mater. Sci. Eng. 31, 29 (1977).CrossRefGoogle Scholar
5Yeh, N. C., Enoki, T., McNeil, L. E., Roth, G., Salamanca-Riba, L., Endo, M., and Dresselhaus, G., MRS Extended Abstracts, Graphite Intercalation Compounds, edited by Eklund, P. C., Dresselhaus, M. S., and Dresselhaus, G. (Materials Research Society, Pittsburgh, PA, 1984), p. 246.Google Scholar
6Salamanca-Riba, L., Ph.D. thesis, Massachusetts Institute of Technology, Cambridge, MA, 1985.Google Scholar
7Spence, J. C. H., Experimental High Resolution Electron Microscopy (Clarendon, Oxford, 1981).CrossRefGoogle Scholar
8Yeh, N. C., Enoki, T., Salamanca-Riba, L., and Dresselhaus, G., Extended Abstracts of the 17th Biennial Conference on Carbon, Lexington, June 1985, p. 194.Google Scholar
9Guérard, D., Elalem, N. E., Takoudjou, C., and Rousseaux, F., Synth. Met. 12, 195 (1985).CrossRefGoogle Scholar
10Doll, G. L. and Eklund, P. C. (to be submitted for publication).Google Scholar
11Enoki, T., Yeh, N. C., Chen, S. T., and Dresselhaus, M. S., Phys. Rev. B 33, 1292 (1986).Google Scholar
12Timp, G., Ph.D. thesis, Massachusetts Institute of Technology, Cambridge, MA, 1983.Google Scholar
13Makrini, M. El, Lagrange, P., Guérard, D., and Hérold, A., Carbon 18, 211 (1980).CrossRefGoogle Scholar
14Lagrange, P., Makrini, M. El, and Hérold, A., Rev. Chim. Minér. 20, 229 (1983).Google Scholar
15Salamanca-Riba, L., Yeh, N. C., Enoki, T., Dresselhaus, M. S., and Endo, M., in Ref. 5, p. 249.Google Scholar
16Hobbs, L. W., in Proceedings of the 25 th Scottish University Summer School in Physics, Glasgow, August 1983, edited by Chapman, J. N. and Craven, A. J. (SUSSP, Edinburgh, 1983), p. 399.Google Scholar
17Trewern, T., Thomas, R. K., Naylor, G., and White, J. W., J. Chem. Soc, Faraday Trans. 1 78, 2369 (1982).Google Scholar
18Trewern, T., Thomas, R. K., and White, J. W., J. Chem. Soc, Faraday Trans. 178, 2399 (1982).Google Scholar
19Endo, M., Chieu, T. C., Timp, G., Dresselhaus, M. S., and Elman, B. S., Phys. Rev. B 28, 6982 (1983).Google Scholar
20Enoki, T., Inokuchi, H., and Sano, M., in Ref. 5, p. 243.Google Scholar