Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T21:28:23.788Z Has data issue: false hasContentIssue false

Heteroepitaxial growth of chemically derived ex situ Ba2YCu3O7−x thin films

Published online by Cambridge University Press:  03 March 2011

Paul C. McIntyre
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02319
Michael J. Cima
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02319
Get access

Abstract

Heteroepitaxial growth of Ba2YCu3O7−x (BYC) thin films prepared by postdeposition annealing on (001) LaAlO3 was characterized by TEM and x-ray diffraction studies of specimens rapidly cooled from various points in the growth heat treatment. Heteroepitaxial nucleation of BYC occurred between 720 and 770 °C during heating at 25 °C/min to the annealing temperature of 830 °C. The c-axis normal BYC rapidly coalesced into a continuous film with nearly complete coverage of the substrate surface after growth of a film of several unit cells thickness. The experimental results were not consistent with purely solid phase heteroepitaxial nucleation and growth or epitaxial grain growth, mechanisms for microstructural evolution of other chemically derived epitaxial oxide thin films. The nature of the transformation and the microstructure of the final superconducting films were consistent, instead, with growth of epitaxial BYC from a liquid phase that is present transiently during the anneal. This hypothesis was supported by thermal analysis results obtained from the precursor material of which the films are composed prior to transformation to BYC.

Type
Articles
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Meyer, O., Weschenfelder, F., Geerk, J., Li, H. C., and Xiong, G. C., Phys. Rev. B 37, 9757 (1988).CrossRefGoogle Scholar
2Ramesh, R., Inam, A., Sands, T., and Rogers, C. T., Mater. Sci. Eng. B 14, 188 (1992).CrossRefGoogle Scholar
3Mankiewich, P. M., Schofield, J. H., Skocpol, W. J., Howard, R. E., Dayem, A. H., and Good, E., Appl. Phys. Lett. 51, 1753 (1987).CrossRefGoogle Scholar
4Eom, C. B., Sun, J. Z., Yamamoto, K., Marshall, A. F., Luther, K. E., Geballe, T. H., and Laderman, S. S., Appl. Phys. Lett. 55, 595 (1989).CrossRefGoogle Scholar
5Inam, A., Hegde, M. S., Wu, X. D., Venkatesan, T., England, P., Miceli, P. F., Chase, E. W., Chang, C. C., Tarascon, J. M., and Wachtman, J. B., Appl. Phys. Lett. 53, 908 (1988).CrossRefGoogle Scholar
6Westerheim, A. C., Mclntyre, P. C., Basu, S. N., Bhatt, D., Yu-Jahnes, L.S., Anderson, A. C., and Cima, M. J., J. Electron Mater. 22, 1113 (1993).CrossRefGoogle Scholar
7Siegal, M. P., Phillips, J. M., van Dover, R.B., Tiefel, T. H., and Marshall, J. H., J. Appl. Phys. 68, 6353 (1990).CrossRefGoogle Scholar
8Feenstra, R., Lindemar, T. B., Budai, J. D., and Galloway, M. D., J. Appl. Phys. 69, 6569 (1991).CrossRefGoogle Scholar
9Mogro-Campero, A. and Turner, L. G., Appl. Phys. Lett. 58, 417 (1991).CrossRefGoogle Scholar
10Siegal, M. P., Hou, S. Y., Phillips, J. M., Tiefel, T. H., and Marshall, J. H., J. Mater. Res. 7, 2658 (1992).CrossRefGoogle Scholar
11Nieh, C. W., Anthony, L., Josefowicz, J. Y., and Krajenbrink, F. G., Appl. Phys. Lett. 56, 2138 (1990).CrossRefGoogle Scholar
12Gupta, A., Jagannathan, R., Cooper, E. I., Geiss, E. A., Landman, J. I., and Hussey, B. W., Appl. Phys. Lett. 52, 2077 (1988).CrossRefGoogle Scholar
13Gupta, A., Cooper, E. I., Jagannathan, R., and Geiss, E. A., in Chemistry of High-Temperature Superconductors II, edited by Nelson, D.L. and George, T. F. (American Chemical Society, Washington, DC, 1988), p. 265.CrossRefGoogle Scholar
14Mclntyre, P. C., Cima, M. J., and Ng, M. F., J. Appl. Phys. 68, 4183 (1990).CrossRefGoogle Scholar
15Mclntyre, P. C., Cima, M. J., Smith, J. A. Jr., Hallock, R. B., Siegal, M. P., and Phillips, J. M., J. Appl. Phys. 71, 1868 (1992).CrossRefGoogle Scholar
16Mclntyre, P. C., Heteroepitaxial Growth of Chemically Derived Ba2 YCu3O7–x Thin Films, Sc.D. Thesis (Department of Materials Science and Engineering, M.I.T., 1993).Google Scholar
17Miller, K. T. and Lange, F. G., in Processing Science of Advanced Ceramics, edited by Aksay, I. A., McVay, G. L., and Ulrich, D. R. (Mater. Res. Soc. Symp. Proc. 155, Pittsburgh, PA, 1989), p. 155.Google Scholar
18Miller, K. T., Chan, C. J., Cain, M. G., and Lange, F. F., J. Mater. Res. 8, 169 (1993).CrossRefGoogle Scholar
19Floro, J. A. and Thompson, C. V., in Thin Film Structures and Phase Stability, edited by Clemens, B. M. and Johnson, W. L. (Mater. Res. Soc. Symp. Proc. 187, Pittsburgh, PA, 1990), p. 274.Google Scholar
20Braunstein, G., Paz-Pujalt, G. R., Mason, M. G., Blanton, T., Barnes, C. L., and Margevich, D., J. Appl. Phys. 73, 961 (1993).CrossRefGoogle Scholar
21Nashimoto, K. and Cima, M. J., Mater. Lett. 10, 348 (1991).CrossRefGoogle Scholar
22Nashimoto, K., Cima, M. J., and Rhine, W. E., in Evolution of Thin Film and Surface Microstructure, edited by Thompson, C. V., Tsao, J. Y., and Srolovitz, D. J. (Mater. Res. Soc. Symp. Proc. 202, Pittsburgh, PA, 1991), p. 439.Google Scholar
23Nashimoto, K., Cima, M. J., and Rhine, W. E., Ceram. Trans. 25, 371 (1992).Google Scholar
24Nashimoto, K., Cima, M. J., Mclntyre, P. C., and Rhine, W. E., unpublished.Google Scholar
25Mclntyre, P. C., Cima, M. J., Ng, M. F., Chiu, R. C., and Rhine, W. E., J. Mater. Res. 5, 2771 (1990).CrossRefGoogle Scholar
26Marshall, A. F., Char, K., Barton, R. W., Kapitulnik, A., and Laderman, S. S., J. Mater. Res. 5, 2049 (1990).CrossRefGoogle Scholar
27Mclntyre, P. C. and Cima, M. J., unpublished.Google Scholar
28Partlow, D. P. and Greggi, J., J. Mater. Res. 2, 595 (1987).CrossRefGoogle Scholar
29Norton, M. G. and Carter, C. B., in Laser Ablation for Materials Synthesis, edited by Paine, D. C. and Bravman, J. C. (Mater. Res. Soc. Symp. Proc. 191, Pittsburgh, PA, 1990), p. 165.Google Scholar
30Gerber, C., Anselmetti, D., Bednorz, J. G., Mannhart, J., and Schlom, D. G., Nature 360, 279 (1991).CrossRefGoogle Scholar
31Hawley, M., Raistrick, I. D., Beery, J. G., and Houlton, R. J., Science 251, 1587 (1991).CrossRefGoogle Scholar
32Lang, H. P., Frey, T., and GUntherodt, H-J., Europhys. Lett. 15, 667 (1991).CrossRefGoogle Scholar
33Roshko, A., NiST, Boulder, CO; personal communication (1992).Google Scholar
34McElfresh, M., Miller, T. G., Schaefer, D. M., Reifenberger, R., Muenchausen, R. E., Hawley, M., Foltyn, S. R., and Wu, X. D., J. Appl. Phys. 71, 5099 (1992).CrossRefGoogle Scholar
35Roshko, A., unpublished work.Google Scholar
36Ramesh, R., Hwang, D. M., Barner, J. B., Nazar, L., Ravi, T. S., Inam, A., Dutta, B., Wu, X. D., and Venkatesan, T., J. Mater. Res. 5, 704 (1990).CrossRefGoogle Scholar
37Wen, J. G., Traeholt, C., and Zandbergen, H. W., Physica C 205, 354 (1993).CrossRefGoogle Scholar
38Marshall, A. F., Barton, R. W., Char, K., Kapitulnik, A., Oh, B., Hammond, R. H., and Laderman, S. S., Phys. Rev. B 37, 9593 (1988).CrossRefGoogle Scholar
39Beyers, R. and Ahn, B. T., Annu. Rev. Mater. Sci. 21, 335 (1991).CrossRefGoogle Scholar
40Ramesh, R., Chang, C. C., Ravi, T. S., Hwang, D. M., A. inam, Xi, X. X., Li, Q., Wu, X. D., and Venkatesan, T., Appl. Phys. Lett. 57, 1064 (1990).CrossRefGoogle Scholar
41Peterson, S. C., Fabrication of Textured Ba2 YCU3O7–x Superconducting Films on Non-Epitaxial Substrates, Ph.D. Thesis (Department of Materials Science and Engineering, M.I.T., 1992).Google Scholar
42Gross, M. E., Hong, M., Liou, S. H., Gallagher, P. K., and Kwo, J., Appl. Phys. Lett. 52, 160 (1988).CrossRefGoogle Scholar
43Chen, Y. L., Mantese, J. V., Hamdi, A. H., and Micheli, A. L., J. Mater. Res. 4, 1065 (1989).CrossRefGoogle Scholar
44Morgan, P. E. D., Housley, R. M., Porter, J. R., and Ratto, J. J., Physica C 176, 279 (1991).CrossRefGoogle Scholar
45Chu, P-Y., Campion, I., and Buchanan, R. C., J. Mater. Res. 8, 261 (1993).CrossRefGoogle Scholar
46Jiang, X. P., Cima, M. J., Brody, H. D., Haggerty, J. S., and Flemings, M. C., in Proceedings of the international Workshop on Superconductivity (ISTEC, Tokyo, Japan, 1992), p. 259.Google Scholar
47Phase Diagrams for High-Tc Superconductors, edited by Whitler, J. D. and Roth, R. S. (The American Ceramics Society, Westerville, OH, 1991).Google Scholar