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Helium ion microscopy of electrospun CNT–polymer composites

Published online by Cambridge University Press:  18 December 2014

Eva M. Campo ,
Eduardo Larios ,
Chuong Huynh  and
Mohan Ananth
Eva M. Campo*
Affiliation:
School of Electronic Engineering, Bangor University, Bangor LL57 1UT, UK; and Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, USA
Eduardo Larios
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, USA
Chuong Huynh
Affiliation:
Carl Zeiss Microscopy, LLC, Ion Microscopy Innovation Center, Peabody, Massachusetts 01960, USA
Mohan Ananth
Affiliation:
Carl Zeiss Microscopy, LLC, Ion Microscopy Innovation Center, Peabody, Massachusetts 01960, USA
*
a) Address all correspondence to this author. e-mail: [email protected], [email protected]
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Abstract

Arrangement and conformational interactions of carbon nanotubes (CNTs) and matrix upon electrospinning have been examined by surface-sensitive helium ion microscopy (He-IM). The enhanced surficial information is mostly a consequence of convoluted topographic sensitivity and reduced electrostatic charging, resulting from He ion–matter interactions. In addition, we have explored the correlation of findings by He-IM imaging with secondary electron microscopy (SEM), transmission electron microscopy (TEM), and near edge x-ray absorption fine structure (NEXAFS) spectroscopy; the latter encouraged by similar sampling depth profiles in both techniques. This study provides further evidence of strong conformational relations between filler and matrix (which we have reported recently) and of the presence of a tightly bound polymeric phase interaction between the CNT and the bulk matrix. We conclude that both the absence of electrostatic charging and enhanced surface sensitivity in He-IM offer a remarkable opportunity to study electrospinning dynamics in nanocomposites.

Type
Articles
Information
Journal of Materials Research , Volume 30 , Issue 1: Focus Issue: Soft Nanomaterials , 14 January 2015 , pp. 130 - 140
Copyright
Copyright © Materials Research Society 2015 

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