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Growth and microstructural characterization of catalyst-free ZnO nanostructures grown on sapphire and GaN by thermal evaporation

Published online by Cambridge University Press:  03 March 2011

Bo Hyun Kong  and
Hyung Koun Cho
Bo Hyun Kong
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Jangan-gu, Suwon, Gyeonggi-do 440-746, Korea
Hyung Koun Cho*
Affiliation:
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Jangan-gu, Suwon, Gyeonggi-do 440-746, Korea
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

ZnO nanostructures were grown directly on sapphire substrates and GaN epilayers by thermal evaporation. Their morphologies and densities were found to be strongly dependent on the synthesis position and the kinds of substrate loaded into the reactor due to the different oxygen densities and the lattice mismatch, respectively. Scanning electron microscopy and transmission electron microscopy studies revealed that ZnO nanorods on sapphire substrates grew in four directions, one 〈0001〉Sapphire and three (1014)Sapphire directions. It was found that the in-plane lattice mismatch of inclined ZnO nanorods was remarkably reduced by forming the planar relationship of (0002)ZnO//(1014)Sapphire, compared to that of (1120)ZnO//(1010)Sapphire in the ZnO film. On the other hand, for the GaN epilayers, vertically well-aligned ZnO nanorods were grown after growing an epitaxial ZnO film due to reduced lattice mismatch. Electron energy-loss spectroscopy data showed that Zn-rich stoichiometry was responsible for the formation of ZnO nanostructures.

Keywords

Crystal growthNanostructureTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 22 , Issue 4 , April 2007 , pp. 937 - 942
Copyright
Copyright © Materials Research Society 2007

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