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Formation of Metallic Nanowires by Utilizing Electromigration

Published online by Cambridge University Press:  03 March 2011

M. Saka*
Affiliation:
Department of Nanomechanics, Graduate School of Engineering, Tohoku University, Aoba-ku, Sendai 980-8579, Japan
R. Ueda
Affiliation:
Department of Nanomechanics, Graduate School of Engineering, Tohoku University, Aoba-ku, Sendai 980-8579, Japan
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A technique for forming metallic nanowires by utilizing electromigration, which is the phenomenon of atomic diffusion due to high current densities, is presented. These diffused atoms can be used for creating metallic nanowires. To specify the position at which a nanowire is formed, some specific conditions need to be established. These conditions are, first, to control the atomic diffusion so the accumulation of atoms produces the desired higher compressive stress; second, to design the structure to control the areas in which diffusion takes place; third, to adjust the thickness of the passivation layer deposited on the metal; and fourth, to form a small slot in the passivation layer through which the compressive stress is released by discharging the diffused atoms. It is shown that when these factors are satisfied, an Al nanowire can be successfully generated in a passivated metal track composed of an Al line buried in a W line.

Type
Articles
Copyright
Copyright © Materials Research Society 2005

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References

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